A package for fast finite element method based simulation of X-ray diffraction from nano-structures

Eugen Wintersberger, Jay Oswald

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this work a novel package for the calculation of the diffracted intensity from nano-structures based on finite element simulations is presented. Besides a short introduction into the algorithm which we have developed two examples namely the diffraction from Si/SiGe systems with ripples and quantum dots with dislocations are shown.

Original languageEnglish (US)
Title of host publicationMaterials Research Society Symposium Proceedings
Pages60-65
Number of pages6
Volume1228
StatePublished - 2010
Externally publishedYes
Event2009 MRS Fall Meeting - Boston, MA, United States
Duration: Nov 30 2009Dec 4 2009

Other

Other2009 MRS Fall Meeting
CountryUnited States
CityBoston, MA
Period11/30/0912/4/09

Fingerprint

ripples
Semiconductor quantum dots
finite element method
Diffraction
quantum dots
Finite element method
X ray diffraction
diffraction
x rays
simulation

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanical Engineering
  • Mechanics of Materials

Cite this

Wintersberger, E., & Oswald, J. (2010). A package for fast finite element method based simulation of X-ray diffraction from nano-structures. In Materials Research Society Symposium Proceedings (Vol. 1228, pp. 60-65)

A package for fast finite element method based simulation of X-ray diffraction from nano-structures. / Wintersberger, Eugen; Oswald, Jay.

Materials Research Society Symposium Proceedings. Vol. 1228 2010. p. 60-65.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Wintersberger, E & Oswald, J 2010, A package for fast finite element method based simulation of X-ray diffraction from nano-structures. in Materials Research Society Symposium Proceedings. vol. 1228, pp. 60-65, 2009 MRS Fall Meeting, Boston, MA, United States, 11/30/09.
Wintersberger E, Oswald J. A package for fast finite element method based simulation of X-ray diffraction from nano-structures. In Materials Research Society Symposium Proceedings. Vol. 1228. 2010. p. 60-65
Wintersberger, Eugen ; Oswald, Jay. / A package for fast finite element method based simulation of X-ray diffraction from nano-structures. Materials Research Society Symposium Proceedings. Vol. 1228 2010. pp. 60-65
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