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A Forward Modeling Approach to High-Reliability Grain Mapping by Laboratory Diffraction Contrast Tomography (LabDCT)
Sridhar Niverty, Jun Sun, Jason Williams, Florian Bachmann, Nicolas Gueninchault, Erik Lauridsen, Nikhilesh Chawla
Research output: Contribution to journal › Article › peer-review
18
Scopus
citations