A flexible design methodology for analog test wrappers in mixed-signal SOCs

Anuja Sehgal, Sule Ozev, Krishnendu Chakrabarty

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

The manufacturing test cost for mixed-signal SOCs is widely recognized to be much higher than that for digital SOCs. It has been shown in recent prior work that the use of analog test wrappers (ATWs) for embedded analog cores in mixed-signal. SOCs reduces test cost. ATWs enable analog test using digital, test access mechanisms, thereby reducing the need for expensive mixed-signal testers. However, analog cores, which tend to be application-specific, evolve more than digital cores with changes in technology. The ATW specifications are therefore subject to change due to the speed/frequency requirements of the newer and faster analog cores that are embedded in the SOC. These changes in specifications require the redesign of the data converters in an ATW. We propose an automated parameter translation and ATW redesign methodology. We demonstrate the effectiveness of our methodology using a set of analog tests specified for a representative analog core. We further study the tradeoffs between test time and silicon area. Experimental results are presented for three TTC'02 benchmark SOCs that have been augmented with five representative, analog cores.

Original languageEnglish (US)
Title of host publicationProceedings - 2005 IEEE International Conference on Computer Design
Subtitle of host publicationVLSI in Computers and Processors, ICCD 2005
Pages137-142
Number of pages6
DOIs
StatePublished - Dec 1 2005
Externally publishedYes
Event2005 IEEE International Conference on Computer Design: VLSI in Computers and Processors, ICCD 2005 - San Jose, CA, United States
Duration: Oct 2 2005Oct 5 2005

Publication series

NameProceedings - IEEE International Conference on Computer Design: VLSI in Computers and Processors
Volume2005
ISSN (Print)1063-6404

Other

Other2005 IEEE International Conference on Computer Design: VLSI in Computers and Processors, ICCD 2005
CountryUnited States
CitySan Jose, CA
Period10/2/0510/5/05

ASJC Scopus subject areas

  • Hardware and Architecture
  • Electrical and Electronic Engineering

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