A 90 nm bulk CMOS radiation hardened by design cache memory

Xiaoyin Yao, Lawrence T. Clark, Dan W. Patterson, Keith Holbert

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A RHBD high performance cache fabricated on 90 nm bulk CMOS is presented. Test silicon cache data arrays can read and write at 1.02 GHz. Irradiation to 2 Mrad(Si) negligibly impacts standby current. The cache is write-through, and relies on error checking to allow cache invalidation when single event upsets or potential single event transients are detected. The write-through cache architectural state will then naturally be reloaded by the ensuing microprocessor operations. Single cycle invalidation is supported. Single event error ion beam test results are presented, as is a description of measured single event effects in array and peripheral circuits and their mitigation by the design.

Original languageEnglish (US)
Title of host publication2009 European Conference on Radiation and Its Effects on Components and Systems
Subtitle of host publication10th RADECS Conference, RADECS 2009
Pages473-480
Number of pages8
DOIs
StatePublished - Dec 1 2009
Event2009 10th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2009 - Bruges, Belgium
Duration: Sep 14 2009Sep 18 2009

Publication series

NameProceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS

Other

Other2009 10th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2009
CountryBelgium
CityBruges
Period9/14/099/18/09

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Keywords

  • CMOS memory integrated circuits
  • Radiation hardening
  • heavy ion beams
  • high-speed integrated circuits

ASJC Scopus subject areas

  • Radiation
  • Electrical and Electronic Engineering

Cite this

Yao, X., Clark, L. T., Patterson, D. W., & Holbert, K. (2009). A 90 nm bulk CMOS radiation hardened by design cache memory. In 2009 European Conference on Radiation and Its Effects on Components and Systems: 10th RADECS Conference, RADECS 2009 (pp. 473-480). [5994698] (Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS). https://doi.org/10.1109/RADECS.2009.5994698