3-D X-ray diffraction imaging with nanoscale resolution using incoherent radiation

Andrei Y. Nikulin, Ruben A. Dilanian, Nadia A. Zatsepin, Brian M. Gable, Barry C. Muddle, Alexei Y. Souvorov, Yoshinori Nishino, Tetsuya Ishikawa

Research output: Contribution to journalArticle

10 Scopus citations


A novel approach to X-ray diffraction data analysis for nondestructive determination of the shape of nanoscale particles and clusters in three-dimensions is illustrated with representative examples of composite nanostructures. The technique is insensitive to the X-ray coherence, which allows 3-D reconstruction of a modal image without tomographic synthesis and in situ analysis of large (over a several cubic millimeters) volume of material with a spatial resolution of few nanometers, rendering the approach suitable for laboratory facilities.

Original languageEnglish (US)
Pages (from-to)1246-1250
Number of pages5
JournalNano Letters
Issue number5
StatePublished - May 1 2007


ASJC Scopus subject areas

  • Bioengineering
  • Chemistry(all)
  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanical Engineering

Cite this

Nikulin, A. Y., Dilanian, R. A., Zatsepin, N. A., Gable, B. M., Muddle, B. C., Souvorov, A. Y., Nishino, Y., & Ishikawa, T. (2007). 3-D X-ray diffraction imaging with nanoscale resolution using incoherent radiation. Nano Letters, 7(5), 1246-1250. https://doi.org/10.1021/nl070131z