Fingerprint
Dive into the research topics of '1/f Noise: Threshold voltage and ON-current fluctuations in 45 nm device technology due to charged random traps'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
1/f Noise: Threshold voltage and ON-current fluctuations in 45 nm device technology due to charged random traps
Nabil Ashraf, Dragica Vasileska
Research output: Contribution to journal › Article › peer-review
3
Scopus
citations