Semiconductor: Collaborative Research: Hierarchical Modeling of Yield and Defectivity to Improve Factory Operations

Project: Research project

Project Details

Description

Semiconductor: Collaborative Research: Hierarchical Modeling of Yield and Defectivity to Improve Factory Operations Collaborative Research: Hierarchical Modeling of Yield and Defectivity to Improve Factory Operations
StatusFinished
Effective start/end date1/1/0512/31/07

Funding

  • National Science Foundation (NSF): $85,223.00

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