SBIR N102-113 Phase II - Innovative Capabilities to Quantify Fatigue Damage and Assessment of Endurance Limit in Spectrum Load Histories

General Description: Provide technical assistance in support of TDAs N102-113 SBIR Phase II effort. Detailed Description: Provide support and reports to the Principal Investigator (Nagaraja Iyyer) as requested encompassing the following areas: 1) Preparation of material sample for scanning electron microscopy (SEM), serial polishing, synchrotron X-ray microtomography, or other techniques to determine grain size and inclusion size distribution. 2) Characterization of material sample to obtain 2D slices with indication of microstructural features with a resolution of a few micrometers. 3) Calculation of grain size dimensions from 2D slices obtained previously. 4) Calculation and characterization of inclusions from 2D slices obtained. 5) Image segmentation and reconstruction of 3D structure of material from predetermined number of 2D slides