Identification of Radiation Response Mechanisms in Medtronic Devices

Project: Research project

Project Details


Identification of Radiation Response Mechanisms in Medtronic Devices Identification of Radiation Response Mechanisms in Medtronic Devices In order to further understand and mitigate the effects of total ionizing dose (TID) degradation in the 0.25um high voltage (HV) technology, Arizona State University proposes to test and characterize the 0.25um technology along a similar project path as performed on Medtronics 3um technology. This effort will enable ASU and Medtronic to develop hardeningby- design (HBD) strategies to exceed targeted radiation tolerance levels in Medtronic integrated circuits (ICs) manufactured in this process. Medtronic, working with ASU, will identify a candidate 0.25 um ICs to use for characterization and analysis. These ICs will have demonstrated parametric susceptibility to ionizing radiation (x-rays and gamma rays). Using these ICs and test structures (de-coupled from circuits and/or residing on test coupons) provided by Medtronic, ASU will perform pre- and post-irradiation testing. Through device-level radiation response analysis and parameter extraction on the experimental data, compact models for transistors and parasitic structures (e.g., gated diodes and field oxide transistors) degraded by total ionizing dose (TID) will be built for use in circuit-level simulations. Radiation response analysis will be supported by of physics-based numerical simulations (i.e. TCAD) to model TID effects in sensitive materials and devices. The results of circuit simulations and layout analysis performed at ASU will facilitate the identification of failure mechanisms (i.e.,soft nodes) in sensitive ICs. Once the mechanisms have been identified, ASU will work with Medtronic to implement HBD and, where possible, process modifications to eliminate the sources of failure with minimal impact on circuit performance. Ionizing Radiation Effects Characterization and Model Development Program for 0.8um CMOS Technology Arizona State University has been contracted by Medtronic to study the effects of Total Ionizing Dose (TID) radiation on Medtronics integrated circuits. As part of that ongoing research effort, ASU worked with Medtronic to irradiate and characterize the 0.25m TSMC technology node. The objectives of the additional tasks proposed in this contract modification are: 1. to extract parameters and build compact models that capture the radiation response characteristics of the irradiated devices, 2. and build TCAD simulation structures in order to numerically model radiationinduced degradation in the devices.
Effective start/end date2/1/1012/31/11


  • INDUSTRY: Domestic Company: $56,000.00


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