Electro-Thermal Scaling Properties of Electron Devices: A Multi-Scale Monte Carlo Approach Electro-Thermal Scaling Properties of Electron Devices .A Multi-Scale Monte Carlo Approach We propose in this document the completion of a modeling approach for the development of a transformational technology based on the thermal management of solid-state devices and their enclosures. By the full inclusion of the phonon dynamics within the framework of charge transport, we will implement extremely efficient particle-based microscopic models in CAD tools for the design of electron devices where the generation and the transport of thermal energy are functionally coupled with their electrical specifications. In order to complement the microscopic models of the particle-based approach, we will integrate them in a numerical framework based on a particle-flux paradigm in which electrons are still treated as particles, while the phonon dynamics is represented as a heat flux. The two modeling approaches will be implemented in a single multi-scale code that will allow the extraction of novel scaling laws and performance metrics by modeling charge and heat transport as a whole property of the devices and their environment. While the algorithmic core of both modeling approaches has been realized and almost completely tested, the present document proposes for funding their completion, the final implementation in production code and its application to realistic device structures. Such code will allow for the first time, to the best of our knowledge, the identification of electro-thermal design metrics and scaling laws for the design of electron devices integrated with their passive heat management components
|Effective start/end date||4/22/15 → 2/21/19|
- DOD-DARPA: Microsystems Technology Office (MTO): $734,127.00
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