Characterization of RF Transceivers Using Digital Testers

Characterization of RF Transceivers Using Digital Testers Characterization of RF Transceivers Using Digital Testers This project aims at developing the theoretical background for extracting the important parameters of RF transceivers using only low-cost digital testers. The transceiver will be placed in a loop-around mode where the full base-band to base-band path is constructed out of the transmitter and the receiver of the device under test (DUT). Through intelligent back-end signal processing and diligent mathematical modeling, we aim at extracting the parameters of the transmitter and receiver in the DUT independently from one another. This all-digital testing strategy will also enable multi-site testing where the decision on each DUT can be made independently.