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Personal profile

Education/Academic qualification

PHD, Pennsylvania State University

… → 2002

MS, Florida A&M University

… → 1999

BE, Shanghai Jiaotong University

… → 1995

Fingerprint Fingerprint is based on mining the text of the experts' scientific documents to create an index of weighted terms, which defines the key subjects of each individual researcher.

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Accelerated Life Test Mathematics
Testing Engineering & Materials Science
Design of experiments Engineering & Materials Science
Degradation Engineering & Materials Science
Accelerated Life Testing Mathematics
Planning Engineering & Materials Science
Product design Engineering & Materials Science
Weibull distribution Engineering & Materials Science

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Research Output 2000 2018

1 Citations

A nonparametric Bayesian network approach to assessing system reliability at early design stages

Lee, D. & Pan, R., Mar 1 2018, In : Reliability Engineering and System Safety. 171, p. 57-66 10 p.

Research output: Contribution to journalArticle

Bayesian networks
Maintainability
Large scale systems
1 Citations

Bayesian planning of step-stress accelerated degradation tests under various optimality criteria

Zhao, X., Pan, R. & Xie, M., Jan 1 2018, (Accepted/In press) In : Applied Stochastic Models in Business and Industry.

Research output: Contribution to journalArticle

Optimality Criteria
Degradation
Planning
Testing
Inspection

Predicting lifetime by degradation tests: A case study of ISO 10995

Fang, G., Rigdon, S. E. & Pan, R., Oct 1 2018, In : Quality and Reliability Engineering International. 34, 6, p. 1228-1237 10 p.

Research output: Contribution to journalArticle

Degradation
Testing
International standards
Atmospheric humidity
Experiments

Quantification of Environmental Effects on PV Module Degradation: A Physics-Based Data-Driven Modeling Method

Subramaniyan, A. B., Pan, R., Kuitche, J. & TamizhMani, G., Sep 1 2018, In : IEEE Journal of Photovoltaics. 8, 5, p. 1289-1296 8 p., 8410667

Research output: Contribution to journalArticle

Environmental impact
Data structures
Physics
modules
degradation
4 Citations

A Bayesian reliability evaluation method with different types of data from multiple sources

Wang, L., Pan, R., Wang, X., Fan, W. & Xuan, J., Nov 1 2017, In : Reliability Engineering and System Safety. 167, p. 128-135 8 p.

Research output: Contribution to journalArticle

Reliability Evaluation
Evaluation Method
Lifetime Data
Degradation
Bernoulli

Projects 2005 2021