Keith Holbert

Assoc Professor

Associate Professor, Connection One (C1)
Associate Professor, Solid State Electronics Research Center (CSSER)
Associate Professor, IAFSE-ECEE: Electrical Engineering
Assoc Professor, Electrical, Computer, and Energy Engineering , School of (ECEE)

1232 Citations
18 h-Index

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Personal profile

Education/Academic qualification

PHD, University of Tennessee-Knoxville

… → 1989

MS, University of Tennessee-Knoxville

… → 1986

BS, University of Tennessee-Knoxville

… → 1984

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Research Output 1988 2018

1232 Citations
18 h-Index
83 Article
81 Conference contribution
3 Chapter
2 Book
2 More
- 2 Patent

The Analysis of Erase Voltage Variability in 70-nm Split-Gate Flash Memory Arrays

Tkachev, Y., Yoo, J. W., Kotov, A., Clark, L. T. & Holbert, K., Jun 19 2018, 2018 IEEE 10th International Memory Workshop, IMW 2018. Institute of Electrical and Electronics Engineers Inc., p. 1-4 4 p.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Flash memory

Electric potential

A Comparative Study on TID Influenced Lateral Diffusion of Group 11 Metals into GexS1-x and GexSe1-x Systems: A Flexible Radiation Sensor Development Perspective

Mahmud, A., Gonzalez Velo, Y., Barnaby, H., Kozicki, M., Mitkova, M., Holbert, K., Goryll, M., Alford, T., Taggart, J. L. & Chen, W., Aug 1 2017, In : IEEE Transactions on Nuclear Science. 64, 8, p. 2292-2299 8 p., 7882640.

Research output: Contribution to journal › Article

traveling ionospheric disturbances

selenides

Radiation

Electrodes

electrodes

Ag-chalcogenide glass flexible radiation sensor: Impact of atomic ratio of Se on the TID influenced lateral diffusion of Ag

Mahmud, A., Gonzalez Velo, Y., Taggart, J., Bamaby, H. J., Kozicki, M., Holbert, K., Mitkova, M., Alford, T., Goryll, M. & Chen, W., Oct 31 2017, 2016 16th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2016. Institute of Electrical and Electronics Engineers Inc., Vol. 2016-September. p. 1-3 3 p.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Ionization

Radiation

ionization

Glass

dosage

In Situ Synaptic Programming of CBRAM in an Ionizing Radiation Environment

Taggart, J. L., Chen, W., Gonzalez Velo, Y., Barnaby, H., Holbert, K. & Kozicki, M., Dec 2 2017, (Accepted/In press) In : IEEE Transactions on Nuclear Science.

Research output: Contribution to journal › Article

Ionizing radiation

programming

ionizing radiation

traveling ionospheric disturbances

Radiation effects

1 Citations

Integrated circuit identification and true random numbers using 1.5-transistor flash memory

Clark, L. T., Adams, J. & Holbert, K., May 2 2017, Proceedings of the 18th International Symposium on Quality Electronic Design, ISQED 2017. IEEE Computer Society, p. 244-249 6 p. 7918323

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Flash memory

Integrated circuits

Transistors

Foundries

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