Keith Holbert

Associate Professor

Associate Professor, IAFSE-ECEE: Electrical Engineering
Associate Professor, IAFSE-ECEE: Connection One (C1)
Associate Professor, IAFSE-ECEE: Solid State Electronics Research Center (CSSER)
Associate Professor, Electrical, Computer, and Energy Engineering, School of (ECEE)

Source: Scopus
Calculated based on no. of publications stored in Pure and citations from Scopus

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Personal profile

Education/Academic qualification

PHD, University of Tennessee-Knoxville

… → 1989

MS, University of Tennessee-Knoxville

… → 1986

BS, University of Tennessee-Knoxville

… → 1984

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1597 Citations
20 h-Index
85 Article
82 Conference contribution
4 Book
3 Chapter
More

Evidence of Interface Trap Build-Up in Irradiated 14-nm Bulk FinFET Technologies
Privat, A., Barnaby, H. J., Spear, M., Esposito, M., Manuel, J. E., Clark, L., Brunhaver, J., Duvnjak, A., Jokai, R., Holbert, K. E., McLain, M. L., Marinella, M. J. & King, M. P., May 2021, In: IEEE Transactions on Nuclear Science. 68, 5, p. 671-676 6 p., 9374449.
Research output: Contribution to journal › Article › peer-review
Total Ionizing Dose Effects on Multistate HfO-Based RRAM Synaptic Array
Han, X., Privat, A., Holbert, K. E., Seo, J., Yu, S. & Barnaby, H. J., May 2021, In: IEEE Transactions on Nuclear Science. 68, 5, p. 756-761 6 p., 9399504.
Research output: Contribution to journal › Article › peer-review
Ionizing radiation tolerance of stacked Si₃N₄-SiO₂ gate insulators for power MOSFETs
Muthuseenu, K., Barnaby, H. J., Patadia, A., Holbert, K. & Privat, A., Jan 2020, In: Microelectronics Reliability. 104, 113554.
Research output: Contribution to journal › Article › peer-review

Open Access
3 Scopus citations
PLuS alliance nuclear engineering online course exchange program
Holbert, K. E., Fletcher, J., Burr, P. A. & Obbard, E. G., 2020, In: Transactions of the American Nuclear Society. 122, p. 43-45 3 p.
Research output: Contribution to journal › Conference article › peer-review
Climate Change Effects on Solar, Wind and Hydro Power Generation
Penmetsa, V. & Holbert, K. E., Oct 2019, 51st North American Power Symposium, NAPS 2019. Institute of Electrical and Electronics Engineers Inc., 9000213. (51st North American Power Symposium, NAPS 2019).
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
1 Scopus citations

6 Active
38 Finished

Characterization of Total Ionizing Dose Response in 22 nm FDX CMOS Technology
Holbert, K., Barnaby, H. & Sanchez Esqueda, I.
Jet Propulsion Laboratory (JPL)
6/4/20 → 6/30/21
Project: Research project
Development of a New Undergraduate Course on Nuclear Security
Holbert, K.
Stanton Foundation
5/1/20 → 4/30/21
Project: Research project
Radiation and Reliability Characterization Chips (RAREChips)
Sanchez Esqueda, I., Holbert, K. & Barnaby, H.
DOD-NAVY-NAVSEA-NSWC: Crane
8/16/19 → 8/16/21
Project: Research project
A Novel, Microscale, Distributable Sensor Technology for Ionizing Radiation
Barnaby, H., Holbert, K. & Gonzalez Velo, Y.
DOD: Defense Threat Reduction Agency (DTRA)
3/28/19 → 3/27/22
Project: Research project
ACEPS-Center for the Advanced Control of Energy and Power Systems
Vittal, V., Tylavsky, D., Heydt, G., Holbert, K., Deviche, P., Ayyanar, R., Weng, Y., Lei, Q., Pal, A., Wu, M. & Hedman, M.
INDUSTRY: Domestic Company
7/1/96 → 8/31/21
Project: Research project