• 1232 Citations
  • 18 h-Index
1988 …2020
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Personal profile

Education/Academic qualification

PHD, University of Tennessee-Knoxville

… → 1989

MS, University of Tennessee-Knoxville

… → 1986

BS, University of Tennessee-Knoxville

… → 1984

Fingerprint Fingerprint is based on mining the text of the experts' scientific documents to create an index of weighted terms, which defines the key subjects of each individual researcher.

  • 4 Similar Profiles
Radiation Engineering & Materials Science
dosage Physics & Astronomy
radiation Physics & Astronomy
Gamma rays Engineering & Materials Science
Sensors Engineering & Materials Science
gamma rays Physics & Astronomy
Data storage equipment Engineering & Materials Science
Irradiation Engineering & Materials Science

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Research Output 1988 2018

The Analysis of Erase Voltage Variability in 70-nm Split-Gate Flash Memory Arrays

Tkachev, Y., Yoo, J. W., Kotov, A., Clark, L. T. & Holbert, K., Jun 19 2018, 2018 IEEE 10th International Memory Workshop, IMW 2018. Institute of Electrical and Electronics Engineers Inc., p. 1-4 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Flash memory
Electric potential
traveling ionospheric disturbances
selenides
Radiation
Electrodes
electrodes

Ag-chalcogenide glass flexible radiation sensor: Impact of atomic ratio of Se on the TID influenced lateral diffusion of Ag

Mahmud, A., Gonzalez Velo, Y., Taggart, J., Bamaby, H. J., Kozicki, M., Holbert, K., Mitkova, M., Alford, T., Goryll, M. & Chen, W., Oct 31 2017, 2016 16th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2016. Institute of Electrical and Electronics Engineers Inc., Vol. 2016-September. p. 1-3 3 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Ionization
Radiation
ionization
Glass
dosage

In Situ Synaptic Programming of CBRAM in an Ionizing Radiation Environment

Taggart, J. L., Chen, W., Gonzalez Velo, Y., Barnaby, H., Holbert, K. & Kozicki, M., Dec 2 2017, (Accepted/In press) In : IEEE Transactions on Nuclear Science.

Research output: Contribution to journalArticle

Ionizing radiation
programming
ionizing radiation
traveling ionospheric disturbances
Radiation effects
1 Citations

Integrated circuit identification and true random numbers using 1.5-transistor flash memory

Clark, L. T., Adams, J. & Holbert, K., May 2 2017, Proceedings of the 18th International Symposium on Quality Electronic Design, ISQED 2017. IEEE Computer Society, p. 244-249 6 p. 7918323

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Flash memory
Integrated circuits
Transistors
Foundries
Error correction

Projects 1989 2020