Personal profile

Education / Academic qualification

BS, University of Tennessee-Knoxville

… → 1984

MS, University of Tennessee-Knoxville

… → 1986

PHD, University of Tennessee-Knoxville

… → 1989

Fingerprint Fingerprint is based on mining the text of the person's scientific documents to create an index of weighted terms, which defines the key subjects of each individual researcher.

  • 3 Similar Profiles
Radiation Engineering & Materials Science
radiation Physics & Astronomy
dosage Physics & Astronomy
Sensors Engineering & Materials Science
Data storage equipment Engineering & Materials Science
Networks (circuits) Engineering & Materials Science
gamma rays Physics & Astronomy
Gamma rays Engineering & Materials Science

Network Recent external collaboration on country level. Dive into details by clicking on the dots.

Research Output 1988 2017

A Comparative Study on TID Influenced Lateral Diffusion of Group 11 Metals into GexS1-x and GexSe1-x Systems: A Flexible Radiation Sensor Development Perspective

Mahmud, A., Gonzalez-Velo, Y., Barnaby, H. J., Kozicki, M. N., Mitkova, M., Holbert, K. E., Goryll, M., Alford, T. L., Taggart, J. L. & Chen, W. Aug 1 2017 In : IEEE Transactions on Nuclear Science. 64, 8, p. 2292-2299 8 p., 7882640

Research output: Research - peer-reviewArticle

traveling ionospheric disturbances
electrodes
sensors
radiation
metals

In Situ Synaptic Programming of CBRAM in an Ionizing Radiation Environment

Taggart, J. L., Chen, W., Gonzalez-Velo, Y., Barnaby, H. J., Holbert, K. & Kozicki, M. N. Dec 2 2017 (Accepted/In press) In : IEEE Transactions on Nuclear Science.

Research output: Research - peer-reviewArticle

programming
ionizing radiation
pulses
Ionizing radiation
traveling ionospheric disturbances

Integrated circuit identification and true random numbers using 1.5-transistor flash memory

Clark, L. T., Adams, J. & Holbert, K. E. May 2 2017 Proceedings of the 18th International Symposium on Quality Electronic Design, ISQED 2017. IEEE Computer Society, p. 244-249 6 p. 7918323

Research output: ResearchConference contribution

Flash memory
Integrated circuits
Transistors
Foundries
Error correction

Reliable techniques for integrated circuit identification and true random number generation using 1.5-transistor flash memory

Clark, L. T., Adams, J. & Holbert, K. E. Jan 1 2017 (Accepted/In press) In : Integration, the VLSI Journal.

Research output: Research - peer-reviewArticle

Random number generation
Flash memory
Integrated circuits
Transistors
Intellectual property

Total Ionizing Dose Effects of Gamma-Ray Radiation on NbOx-Based Selector Devices for Crossbar Array Memory

Gao, L., Holbert, K. E. & Yu, S. Jun 1 2017 In : IEEE Transactions on Nuclear Science. 64, 6, p. 1535-1539 5 p., 7917355

Research output: Research - peer-reviewArticle

selectors
gamma rays
dosage
radiation
Gamma rays

Projects 1989 2018

Nuclear reactors
Electronic equipment
Radiation
Networks (circuits)
Accidents
neutron counters
signal processing
solid state
output
detectors