Fingerprint Fingerprint is based on mining the text of the person's scientific documents to create an index of weighted terms, which defines the key subjects of each individual researcher.

  • 13 Similar Profiles
Power amplifiers Engineering & Materials Science
Networks (circuits) Engineering & Materials Science
Built-in self test Engineering & Materials Science
Switches Engineering & Materials Science
Modulators Engineering & Materials Science
Calibration Engineering & Materials Science
Transceivers Engineering & Materials Science
Transmitters Engineering & Materials Science

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Research Output 2003 2017

  • 138 Citations
  • 5 h-Index
  • 14 Conference contribution
  • 7 Article

A comprehensive bist solution for polar transceivers using on-chip resources

Jeong, J. W., Natarajan, V., Sen, S., Mak, T., Kitchen, J. & Ozev, S. Jul 1 2017 In : ACM Transactions on Design Automation of Electronic Systems. 23, 1, 2

Research output: Research - peer-reviewArticle

Intermodulation distortion
Built-in self test

CMOS integrated galvanically isolated RF chip-to-chip communication utilizing lateral resonant coupling

Javid, M., Burton, R., Ptacek, K. & Kitchen, J. Jul 5 2017 RFIC 2017 - Proceedings of the 2017 IEEE Radio Frequency Integrated Circuits Symposium. Institute of Electrical and Electronics Engineers Inc., p. 252-255 4 p. 7969065

Research output: ResearchConference contribution

Networks (circuits)
Electric potential

GaN-on-Si switched mode RF power amplifiers for non-constant envelope signals

Shukla, S. & Kitchen, J. Mar 10 2017 Proceedings of the 2017 IEEE Topical Conference on Power Amplifiers for Wireless and Radio Applications, PAWR 2017. Institute of Electrical and Electronics Engineers Inc., p. 88-91 4 p. 7875581

Research output: ResearchConference contribution

Power amplifiers
Base stations
3 Citations

Built-In Self-Test and Digital Calibration of Zero-IF RF Transceivers

Jeong, J. W., Nassery, A., Kitchen, J. N. & Ozev, S. Jan 6 2016 (Accepted/In press) In : IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

Research output: Research - peer-reviewArticle

Built-in self test
Time measurement

Monitor-Based In-Field Wearout Mitigation for CMOS LC Oscillators

Chang, D., Kitchen, J. N., Bakkaloglu, B., Kiaei, S. & Ozev, S. Jun 1 2016 In : IEEE Transactions on Device and Materials Reliability. 16, 2, p. 183-193 11 p., 7457652

Research output: Research - peer-reviewArticle

Networks (circuits)
Aging of materials

Projects 2013 2019