Equipments Details
Description
Diffractometer for thin films both single crystals and polycrystalline (diffraction and XRR) from RT to 900°C, also used to measure powder sample.
Measurements we can do:
Crystal orientation / offcut
Degree of crystallinity
Stresses/strain of single crystal thin film
Spatial mapping (100 x 100 mm motion) of sample surfaces
High speed wide angle x-ray diffraction and fast mode reciprocal space mapping
density and film thickness determination (x-ray reflectivity XRR)
Pole figure
Low angle measurement as low as 0.1 °
Contact: Emmanuel Soignard and David Wright
Measurements we can do:
Crystal orientation / offcut
Degree of crystallinity
Stresses/strain of single crystal thin film
Spatial mapping (100 x 100 mm motion) of sample surfaces
High speed wide angle x-ray diffraction and fast mode reciprocal space mapping
density and film thickness determination (x-ray reflectivity XRR)
Pole figure
Low angle measurement as low as 0.1 °
Contact: Emmanuel Soignard and David Wright
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