SEMTE High-Resolution Xray Diffractometer

    Equipment/facility: Equipment

    • Location

      United States

    Equipments Details

    Description

    Diffractometer for thin films both single crystals and polycrystalline (diffraction and XRR) from RT to 900°C, also used to measure powder sample.

    Measurements we can do:

    Crystal orientation / offcut
    Degree of crystallinity
    Stresses/strain of single crystal thin film
    Spatial mapping (100 x 100 mm motion) of sample surfaces
    High speed wide angle x-ray diffraction and fast mode reciprocal space mapping
    density and film thickness determination (x-ray reflectivity XRR)
    Pole figure
    Low angle measurement as low as 0.1 °

    Contact: Emmanuel Soignard and David Wright

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