Sub-femtosecond free-electron laser pulses

W. Helml, A. R. Maier, W. Schweinberger, I. Grguras, P. Radcliffe, G. Doumy, C. Roedig, J. Gagnon, Marc Messerschmidt, S. Schorb, C. Bostedt, F. Gruner, L. F. Dimauro, D. Cubaynes, J. D. Bozek, Th Tschentscher, J. T. Costello, M. Meyer, R. Coffee, S. DustererA. L. Cavalieri, R. Kienberger

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Deploying the so-called 'Streaking Spectroscopy' technique at LCLS, we demonstrate a non-invasive scheme for temporal characterization of X-ray pulses with sub-femtosecond resolution. Analyzing the substructure indicates pulse durations on the order of hundreds of attoseconds.

Original languageEnglish (US)
Title of host publication2015 Conference on Lasers and Electro-Optics, CLEO 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
Volume2015-August
ISBN (Electronic)9781557529688
StatePublished - Aug 10 2015
Externally publishedYes
EventConference on Lasers and Electro-Optics, CLEO 2015 - San Jose, United States
Duration: May 10 2015May 15 2015

Other

OtherConference on Lasers and Electro-Optics, CLEO 2015
CountryUnited States
CitySan Jose
Period5/10/155/15/15

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Atomic and Molecular Physics, and Optics
  • Electronic, Optical and Magnetic Materials

Fingerprint Dive into the research topics of 'Sub-femtosecond free-electron laser pulses'. Together they form a unique fingerprint.

Cite this