Abstract
A memory system which rapidly chooses the stored item most closely matching a given input is fundamental to a number of recognition tasks. The topic of this paper is a memory architecture which performs this function. In addition, a measure of the quality of the selected (best matching) memory is generated. The architecture is capable of significant data throughput rates, and is amenable to implementation using conventional digital VLSI fabrication processes. These characteristics are demonstrated by a prototype device fabricated using the MOSIS 3-(im CMOS design rules which can compare more than two million 9-bit input words per second. Behavioral simulations demonstrate the applicability of the architecture to some basic recognition tasks.
Original language | English (US) |
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Pages (from-to) | 28-34 |
Number of pages | 7 |
Journal | IEEE Journal of Solid-State Circuits |
Volume | 24 |
Issue number | 1 |
DOIs | |
State | Published - Feb 1989 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering