Multiscale Modeling of Total Ionizing Dose Effects in Commercial-off-the-Shelf Parts in Bipolar Technologies

A. Privat; Hugh Barnaby; P. C. Adell; B. S. Tolleson; Y. Wang; X. Han; P. Davis; B. R. Rax; T. E. Buchheit

doi:10.1109/TNS.2018.2887235

Multiscale Modeling of Total Ionizing Dose Effects in Commercial-off-the-Shelf Parts in Bipolar Technologies

A. Privat, Hugh Barnaby, P. C. Adell, B. S. Tolleson, Y. Wang, X. Han, P. Davis, B. R. Rax, T. E. Buchheit

Research output: Contribution to journal › Article › peer-review

9 Scopus citations

Abstract

A multiscale modeling platform that supports the 'virtual' qualification of commercial-off-the-shelf parts is presented. The multiscale approach is divided into two modules. The first module generates information related to the bipolar junction transistor gain degradation that is a function of fabrication process, operational, and environmental inputs. The second uses this information as inputs for radiation-enabled circuit simulations. The prototype platform described in this paper estimates the total ionizing dose and dose rate responses of linear bipolar integrated circuits for different families of components. The simulation and experimental results show good correlation and suggest this platform to be a complementary tool within the radiation-hardness assurance flow. The platform may reduce some of the costly reliance on testing for all systems.

Original language	English (US)
Article number	8579161
Pages (from-to)	190-198
Number of pages	9
Journal	IEEE Transactions on Nuclear Science
Volume	66
Issue number	1
DOIs	https://doi.org/10.1109/TNS.2018.2887235
State	Published - Jan 2019

Keywords

Bipolar transistor
commercial-off-the-shelf (COTS)
enhanced low-dose rate sensitivity (ELDRS)
modeling
n-p-n
p-n-p
qualification
total ionizing dose (TID)

ASJC Scopus subject areas

Nuclear and High Energy Physics
Nuclear Energy and Engineering
Electrical and Electronic Engineering

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10.1109/TNS.2018.2887235

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title = "Multiscale Modeling of Total Ionizing Dose Effects in Commercial-off-the-Shelf Parts in Bipolar Technologies",

abstract = "A multiscale modeling platform that supports the 'virtual' qualification of commercial-off-the-shelf parts is presented. The multiscale approach is divided into two modules. The first module generates information related to the bipolar junction transistor gain degradation that is a function of fabrication process, operational, and environmental inputs. The second uses this information as inputs for radiation-enabled circuit simulations. The prototype platform described in this paper estimates the total ionizing dose and dose rate responses of linear bipolar integrated circuits for different families of components. The simulation and experimental results show good correlation and suggest this platform to be a complementary tool within the radiation-hardness assurance flow. The platform may reduce some of the costly reliance on testing for all systems.",

keywords = "Bipolar transistor, commercial-off-the-shelf (COTS), enhanced low-dose rate sensitivity (ELDRS), modeling, n-p-n, p-n-p, qualification, total ionizing dose (TID)",

author = "A. Privat and Hugh Barnaby and Adell, {P. C.} and Tolleson, {B. S.} and Y. Wang and X. Han and P. Davis and Rax, {B. R.} and Buchheit, {T. E.}",

note = "Funding Information: Manuscript received November 30, 2018; revised December 11, 2018; accepted December 13, 2018. Date of publication December 17, 2018; date of current version January 17, 2019. This work was supported in part by the National Aeronautics and Space Administration, in part by the Jet Propulsion Laboratory under Contract 1562540, and in part by Sandia National Laboratories for the U.S. Department of Energy{\textquoteright}s National Nuclear Security Administration under Contract DE-NA0003525. Publisher Copyright: {\textcopyright} 2018 IEEE.",

year = "2019",

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doi = "10.1109/TNS.2018.2887235",

language = "English (US)",

volume = "66",

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AU - Wang, Y.

AU - Han, X.

AU - Davis, P.

AU - Rax, B. R.

AU - Buchheit, T. E.

N1 - Funding Information: Manuscript received November 30, 2018; revised December 11, 2018; accepted December 13, 2018. Date of publication December 17, 2018; date of current version January 17, 2019. This work was supported in part by the National Aeronautics and Space Administration, in part by the Jet Propulsion Laboratory under Contract 1562540, and in part by Sandia National Laboratories for the U.S. Department of Energy’s National Nuclear Security Administration under Contract DE-NA0003525. Publisher Copyright: © 2018 IEEE.

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Multiscale Modeling of Total Ionizing Dose Effects in Commercial-off-the-Shelf Parts in Bipolar Technologies

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Keywords

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