Zero-loss energy filtered REM and RHEED observations on rutile (110) surface

L. Wang, Jingyue Liu, J. M. Cowley

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

An investigation of oxygen-annealed rutile (110) surface using zero-loss energy filtered reflection electron microscopy (REM) and reflection high energy electron diffraction (RHEED) is reported in this paper. In REM, the surface reflection electrons undergo both elastic and inelastic scattering within a crystal. In RHEED, 50% to 90% of the electrons contributing to surface reflection spots used for imaging have suffered energy loss of more than 10 eV. All REM images and RHEED patterns were recorded digitally into picture of 1024×1024 pixels.

Original languageEnglish (US)
Title of host publicationProceedings - Annual Meeting, Microscopy Society of America
PublisherPubl by San Francisco Press Inc
Pages968-969
Number of pages2
StatePublished - 1993
EventProceedings of the 51st Annual Meeting Microscopy Society of America - Cincinnati, OH, USA
Duration: Aug 1 1993Aug 6 1993

Other

OtherProceedings of the 51st Annual Meeting Microscopy Society of America
CityCincinnati, OH, USA
Period8/1/938/6/93

ASJC Scopus subject areas

  • Engineering(all)

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    Wang, L., Liu, J., & Cowley, J. M. (1993). Zero-loss energy filtered REM and RHEED observations on rutile (110) surface. In Proceedings - Annual Meeting, Microscopy Society of America (pp. 968-969). Publ by San Francisco Press Inc.