X-ray topography characterization of gallium nitride substrates for power device development

Balaji Raghothamachar, Yafei Liu, Hongyu Peng, Tuerxun Ailihumaer, Michael Dudley, F. Shadi Shahedipour-Sandvik, Kenneth A. Jones, Andrew Armstrong, Andrew A. Allerman, Jung Han, Houqiang Fu, Kai Fu, Yuji Zhao

Research output: Contribution to journal › Article › peer-review

23 Scopus citations

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