X-RAY MICROANALYSIS AND HIGH RESOLUTION IMAGING OF Ge-Au-Ni METAL LAYERS ON GALLIUM ARSENIDE.

D. Fathy, O. L. Krivanek, John Spence, W. M. Paulson

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)
Original languageEnglish (US)
Title of host publicationMaterials Research Society Symposia Proceedings
Place of PublicationNew York, NY, USA
PublisherNorth-Holland
Pages557-562
Number of pages6
Volume25
ISBN (Print)0444009051
StatePublished - 1984
Externally publishedYes

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microanalysis
gallium
high resolution
metals
x rays

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

Cite this

Fathy, D., Krivanek, O. L., Spence, J., & Paulson, W. M. (1984). X-RAY MICROANALYSIS AND HIGH RESOLUTION IMAGING OF Ge-Au-Ni METAL LAYERS ON GALLIUM ARSENIDE. In Materials Research Society Symposia Proceedings (Vol. 25, pp. 557-562). New York, NY, USA: North-Holland.

X-RAY MICROANALYSIS AND HIGH RESOLUTION IMAGING OF Ge-Au-Ni METAL LAYERS ON GALLIUM ARSENIDE. / Fathy, D.; Krivanek, O. L.; Spence, John; Paulson, W. M.

Materials Research Society Symposia Proceedings. Vol. 25 New York, NY, USA : North-Holland, 1984. p. 557-562.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Fathy, D, Krivanek, OL, Spence, J & Paulson, WM 1984, X-RAY MICROANALYSIS AND HIGH RESOLUTION IMAGING OF Ge-Au-Ni METAL LAYERS ON GALLIUM ARSENIDE. in Materials Research Society Symposia Proceedings. vol. 25, North-Holland, New York, NY, USA, pp. 557-562.
Fathy D, Krivanek OL, Spence J, Paulson WM. X-RAY MICROANALYSIS AND HIGH RESOLUTION IMAGING OF Ge-Au-Ni METAL LAYERS ON GALLIUM ARSENIDE. In Materials Research Society Symposia Proceedings. Vol. 25. New York, NY, USA: North-Holland. 1984. p. 557-562
Fathy, D. ; Krivanek, O. L. ; Spence, John ; Paulson, W. M. / X-RAY MICROANALYSIS AND HIGH RESOLUTION IMAGING OF Ge-Au-Ni METAL LAYERS ON GALLIUM ARSENIDE. Materials Research Society Symposia Proceedings. Vol. 25 New York, NY, USA : North-Holland, 1984. pp. 557-562
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