X-RAY MICROANALYSIS AND HIGH RESOLUTION IMAGING OF Ge-Au-Ni METAL LAYERS ON GALLIUM ARSENIDE.

D. Fathy, O. L. Krivanek, J. C.H. Spence, W. M. Paulson

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Scopus citations
Original languageEnglish (US)
Title of host publicationMaterials Research Society Symposia Proceedings
PublisherNorth-Holland
Pages557-562
Number of pages6
ISBN (Print)0444009051
StatePublished - Jan 1 1984
Externally publishedYes

Publication series

NameMaterials Research Society Symposia Proceedings
Volume25
ISSN (Print)0272-9172

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

Cite this

Fathy, D., Krivanek, O. L., Spence, J. C. H., & Paulson, W. M. (1984). X-RAY MICROANALYSIS AND HIGH RESOLUTION IMAGING OF Ge-Au-Ni METAL LAYERS ON GALLIUM ARSENIDE. In Materials Research Society Symposia Proceedings (pp. 557-562). (Materials Research Society Symposia Proceedings; Vol. 25). North-Holland.