X-ray diffraction analysis of the strain of SiGeC/(100)Si alloys

A. E. Bair, Terry Alford, S. Sego, Z. Atzmon, Robert Culbertson

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Fingerprint

Dive into the research topics of 'X-ray diffraction analysis of the strain of SiGeC/(100)Si alloys'. Together they form a unique fingerprint.

Engineering & Materials Science

Chemical Compounds