Welcome message

Ajith Abraham, Adel M. Alimi, Abdelkrim Haqiq, Dijiang Huang, Dong Soeng Kim, Hannan Xiao, Nizar Rokbani, Jaouad Dabounou, Ali Wali

Research output: Contribution to journalEditorial

Original languageEnglish (US)
Article number7492738
JournalUnknown Journal
DOIs
StatePublished - Jun 15 2016

ASJC Scopus subject areas

  • Computer Networks and Communications
  • Information Systems
  • Information Systems and Management
  • Safety, Risk, Reliability and Quality

Cite this

Abraham, A., Alimi, A. M., Haqiq, A., Huang, D., Soeng Kim, D., Xiao, H., ... Wali, A. (2016). Welcome message. Unknown Journal, [7492738]. https://doi.org/10.1109/ISIAS.2015.7492738

Welcome message. / Abraham, Ajith; Alimi, Adel M.; Haqiq, Abdelkrim; Huang, Dijiang; Soeng Kim, Dong; Xiao, Hannan; Rokbani, Nizar; Dabounou, Jaouad; Wali, Ali.

In: Unknown Journal, 15.06.2016.

Research output: Contribution to journalEditorial

Abraham, A, Alimi, AM, Haqiq, A, Huang, D, Soeng Kim, D, Xiao, H, Rokbani, N, Dabounou, J & Wali, A 2016, 'Welcome message', Unknown Journal. https://doi.org/10.1109/ISIAS.2015.7492738
Abraham A, Alimi AM, Haqiq A, Huang D, Soeng Kim D, Xiao H et al. Welcome message. Unknown Journal. 2016 Jun 15. 7492738. https://doi.org/10.1109/ISIAS.2015.7492738
Abraham, Ajith ; Alimi, Adel M. ; Haqiq, Abdelkrim ; Huang, Dijiang ; Soeng Kim, Dong ; Xiao, Hannan ; Rokbani, Nizar ; Dabounou, Jaouad ; Wali, Ali. / Welcome message. In: Unknown Journal. 2016.
@article{299ae7188b6a4676ac947c6e0532e11b,
title = "Welcome message",
author = "Ajith Abraham and Alimi, {Adel M.} and Abdelkrim Haqiq and Dijiang Huang and {Soeng Kim}, Dong and Hannan Xiao and Nizar Rokbani and Jaouad Dabounou and Ali Wali",
year = "2016",
month = "6",
day = "15",
doi = "10.1109/ISIAS.2015.7492738",
language = "English (US)",
journal = "Scanning Electron Microscopy",
issn = "0586-5581",
publisher = "Scanning Microscopy International",

}

TY - JOUR

T1 - Welcome message

AU - Abraham, Ajith

AU - Alimi, Adel M.

AU - Haqiq, Abdelkrim

AU - Huang, Dijiang

AU - Soeng Kim, Dong

AU - Xiao, Hannan

AU - Rokbani, Nizar

AU - Dabounou, Jaouad

AU - Wali, Ali

PY - 2016/6/15

Y1 - 2016/6/15

UR - http://www.scopus.com/inward/record.url?scp=84979573638&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84979573638&partnerID=8YFLogxK

U2 - 10.1109/ISIAS.2015.7492738

DO - 10.1109/ISIAS.2015.7492738

M3 - Editorial

AN - SCOPUS:84979573638

JO - Scanning Electron Microscopy

JF - Scanning Electron Microscopy

SN - 0586-5581

M1 - 7492738

ER -