Weight tuning of resistive memories and convolution kernel operation on cross-point array for neuro-inspired computing

Ligang Gao, Pai Yu Chen, Shimeng Yu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

Analog conductance of resistive memories is attractive for implementing the weights in neuro-inspired algorithms. One of the most popular deep learning algorithms is the convolutional neural network (CNN). In this paper, we review our recent progress on using resistive memories for neuro-inspired computing. First, we optimized the iterative programming protocol to tune the weights of HfOx based resistive memories by adjusting the pulse amplitude incremental steps, the pulse width incremental steps, and the start voltages. Then, we demonstrated the key operation in the CNN-the convolution kernel on a 12×12 cross-point array. As a proof-of-concept demonstration, we use the offline trained edge filters to detect both horizontal and vertical edges of the 50×50 pixels of a grayscale dog image. The experimental kernel operation matches the simulation results.

Original languageEnglish (US)
Title of host publication2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2016 - Proceedings
EditorsYu-Long Jiang, Ting-Ao Tang, Ru Huang
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages247-250
Number of pages4
ISBN (Electronic)9781467397179
DOIs
StatePublished - 2016
Event13th IEEE International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2016 - Hangzhou, China
Duration: Oct 25 2016Oct 28 2016

Publication series

Name2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2016 - Proceedings

Other

Other13th IEEE International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2016
Country/TerritoryChina
CityHangzhou
Period10/25/1610/28/16

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality
  • Electronic, Optical and Magnetic Materials

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