Abstract
The authors describe experimentation done in establishing techniques for laboratory growth and analytical characterization of water trees. Techniques used include scanning electron microscopy (SEM), transmission electron microscopy (TEM), energy dispersive X-ray spectroscopy, and Fourier transform infrared spectroscopy (FTIR). Measurements of electrical properties such as capacitance, dissipation factor, and leakage current were made, but no significant differences between the virgin, field aged, and treed samples were measured. SEM and TEM techniques do indicate differences between virgin, field-aged, and vented tree cross-linked polyethylene (XLPE) samples. The FTIR technique shows that the tree retardant compound (TRC) may change the composition of the tree region. Preliminary results of characterization of virgin, field aged (without trees), and treed XLPE samples with and without treatment with the TRC are presented.
| Original language | English (US) |
|---|---|
| Title of host publication | Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report |
| Publisher | Publ by IEEE |
| Pages | 404-409 |
| Number of pages | 6 |
| State | Published - Oct 1990 |
| Event | 1990 Conference on Electrical Insulation and Dielectric Phenomena - Pocono Manor, PA, USA Duration: Oct 28 1990 → Oct 31 1990 |
Other
| Other | 1990 Conference on Electrical Insulation and Dielectric Phenomena |
|---|---|
| City | Pocono Manor, PA, USA |
| Period | 10/28/90 → 10/31/90 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Industrial and Manufacturing Engineering
- Building and Construction