Wafer-level RF test and DfT for VCO modulating transceiver architecures

Sule Ozev, Christian Olgaard

Research output: Chapter in Book/Report/Conference proceedingConference contribution

26 Scopus citations


Traditionally, radio frequency (RF) paths are bypassed during wafer sort due to the high cost of RF testing. Increasing packaging costs, however, result in a need for a more thorough wafer-level testing including the RF path. In this paper, we propose a loop-back architecture, along with a novel, all-digital design-for-testability (DfT) modification that enables cost efficient testing of various defects at the wafer level. These methods are applicable to a wide range of cost-sensitive applications that use the modulation of the voltage-controlled-oscillator(VCO). Experimental results using a Bluetooth platform and considering a variety of defects confirm the viability of the approach.

Original languageEnglish (US)
Title of host publicationProceedings of the IEEE VLSI Test Symposium
Number of pages6
Publication statusPublished - 2004
Externally publishedYes
EventProceedings - 22nd IEEE VLSI Test Symposium - Napa Valley, CA, United States
Duration: Apr 25 2004Apr 29 2004


OtherProceedings - 22nd IEEE VLSI Test Symposium
CountryUnited States
CityNapa Valley, CA


ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Ozev, S., & Olgaard, C. (2004). Wafer-level RF test and DfT for VCO modulating transceiver architecures. In Proceedings of the IEEE VLSI Test Symposium (pp. 217-222) https://doi.org/10.1109/VTEST.2004.1299246