Voltage risk assessment

James D. McCalley, Hua Wan, Vijay Vittal, Yougie Dai, Nicholas Abi-Samra

Research output: Chapter in Book/Report/Conference proceedingConference contribution

30 Scopus citations

Abstract

This paper describes computational techniques for computing risk associated with voltage insecurity, where risk is assessed as the product of probability and consequence of under-voltage and voltage collapse. In contrast to deterministic assessment of voltage security, our approach directly accounts for uncertainties in the analysis. An approach for operational assessment is provided that uses continuation power flow methods. In addition, a planning approach is described which utilizes an interior point optimization method to identify maximum loading conditions over a sequential trajectory of operating conditions. Analysis of the IEEE Reliability Test System illustrates results that are obtained from the approaches.

Original languageEnglish (US)
Title of host publication1999 IEEE Power Engineering Society Summer Meeting, PES 1999 - Conference Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages179-184
Number of pages6
ISBN (Electronic)0780355695, 9780780355699
DOIs
StatePublished - 1999
Externally publishedYes
Event1999 IEEE Power Engineering Society Summer Meeting, PES 1999 - Edmonton, Canada
Duration: Jul 18 1999Jul 22 1999

Publication series

Name1999 IEEE Power Engineering Society Summer Meeting, PES 1999 - Conference Proceedings
Volume1

Other

Other1999 IEEE Power Engineering Society Summer Meeting, PES 1999
Country/TerritoryCanada
CityEdmonton
Period7/18/997/22/99

Keywords

  • Operations
  • Planning
  • Probabilistic risk
  • Security
  • Transmission
  • Voltage collapse

ASJC Scopus subject areas

  • Economics, Econometrics and Finance (miscellaneous)
  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality

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