Voltage flicker estimation based on linearization and Lp norms

G. T. Heydt; M. Bakroun; A. Inan

doi:10.1109/TPWRD.2003.817533

Voltage flicker estimation based on linearization and L_p norms

G. T. Heydt, M. Bakroun, A. Inan

Research output: Contribution to journal › Article › peer-review

19 Scopus citations

Abstract

This paper presents an approach to estimate voltage flicker components magnitudes and frequencies. The approach is based on L_p norms (p = 1, 2 and ∞) and Taylor series linearization. Effects of sampling frequency, number of samples, time interval, and noise are introduced. The main result is that it is possible to design an L_p estimator to identify flicker frequency and amplitude from time series measurements.

Original language	English (US)
Pages (from-to)	1564-1566
Number of pages	3
Journal	IEEE Transactions on Power Delivery
Volume	18
Issue number	4
DOIs	https://doi.org/10.1109/TPWRD.2003.817533
State	Published - Oct 2003

Keywords

Flicker
L estimation
Least absolute value
Least squares
Linearization
Maximum absolute deviation
Power quality
Taylor series

ASJC Scopus subject areas

Energy Engineering and Power Technology
Electrical and Electronic Engineering

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10.1109/TPWRD.2003.817533

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@article{0c93a5f861894d0f9fcd85dcadf103b4,

title = "Voltage flicker estimation based on linearization and Lp norms",

abstract = "This paper presents an approach to estimate voltage flicker components magnitudes and frequencies. The approach is based on Lp norms (p = 1, 2 and ∞) and Taylor series linearization. Effects of sampling frequency, number of samples, time interval, and noise are introduced. The main result is that it is possible to design an Lp estimator to identify flicker frequency and amplitude from time series measurements.",

keywords = "Flicker, L estimation, Least absolute value, Least squares, Linearization, Maximum absolute deviation, Power quality, Taylor series",

author = "Heydt, {G. T.} and M. Bakroun and A. Inan",

year = "2003",

month = oct,

doi = "10.1109/TPWRD.2003.817533",

language = "English (US)",

volume = "18",

pages = "1564--1566",

journal = "IEEE Transactions on Power Delivery",

issn = "0885-8977",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "4",

}

TY - JOUR

T1 - Voltage flicker estimation based on linearization and Lp norms

AU - Heydt, G. T.

AU - Bakroun, M.

AU - Inan, A.

PY - 2003/10

Y1 - 2003/10

N2 - This paper presents an approach to estimate voltage flicker components magnitudes and frequencies. The approach is based on Lp norms (p = 1, 2 and ∞) and Taylor series linearization. Effects of sampling frequency, number of samples, time interval, and noise are introduced. The main result is that it is possible to design an Lp estimator to identify flicker frequency and amplitude from time series measurements.

AB - This paper presents an approach to estimate voltage flicker components magnitudes and frequencies. The approach is based on Lp norms (p = 1, 2 and ∞) and Taylor series linearization. Effects of sampling frequency, number of samples, time interval, and noise are introduced. The main result is that it is possible to design an Lp estimator to identify flicker frequency and amplitude from time series measurements.

KW - Flicker

KW - L estimation

KW - Least absolute value

KW - Least squares

KW - Linearization

KW - Maximum absolute deviation

KW - Power quality

KW - Taylor series

UR - http://www.scopus.com/inward/record.url?scp=0141883144&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0141883144&partnerID=8YFLogxK

U2 - 10.1109/TPWRD.2003.817533

DO - 10.1109/TPWRD.2003.817533

M3 - Article

AN - SCOPUS:0141883144

VL - 18

SP - 1564

EP - 1566

JO - IEEE Transactions on Power Delivery

JF - IEEE Transactions on Power Delivery

SN - 0885-8977

IS - 4

ER -