VLSI CIRCUIT TESTING USING AN ADAPTIVE OPTIMIZATION MODEL.

Philip S. Yu, C. M. Krishna, Yann-Hang Lee

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The purpose of testing is to determine the correctness of the unit under test in some optimal way. One difficulty in meeting the optimality requirement is that the stochastic properties of the unit are usually unknown a priori; e. g. , the yield of a VLSI production line might not be known exactly before the chips made as a result are tested. Given the probability of unit failure and the coverage of a test, the optimal test period is easy to obtain. However, the probability of failure is not usually known a priori. The authors therefore develop an optimal sequential testing strategy which estimates the production yield based on ongoing test results, and then use it to determine the optimal test period.

Original languageEnglish (US)
Title of host publicationProceedings - Design Automation Conference
Place of PublicationNew York, NY, USA
PublisherIEEE
Pages399-406
Number of pages8
ISBN (Print)0818607815
StatePublished - 1987
Externally publishedYes

Fingerprint

VLSI circuits
Testing

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Yu, P. S., Krishna, C. M., & Lee, Y-H. (1987). VLSI CIRCUIT TESTING USING AN ADAPTIVE OPTIMIZATION MODEL. In Proceedings - Design Automation Conference (pp. 399-406). New York, NY, USA: IEEE.

VLSI CIRCUIT TESTING USING AN ADAPTIVE OPTIMIZATION MODEL. / Yu, Philip S.; Krishna, C. M.; Lee, Yann-Hang.

Proceedings - Design Automation Conference. New York, NY, USA : IEEE, 1987. p. 399-406.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Yu, PS, Krishna, CM & Lee, Y-H 1987, VLSI CIRCUIT TESTING USING AN ADAPTIVE OPTIMIZATION MODEL. in Proceedings - Design Automation Conference. IEEE, New York, NY, USA, pp. 399-406.
Yu PS, Krishna CM, Lee Y-H. VLSI CIRCUIT TESTING USING AN ADAPTIVE OPTIMIZATION MODEL. In Proceedings - Design Automation Conference. New York, NY, USA: IEEE. 1987. p. 399-406
Yu, Philip S. ; Krishna, C. M. ; Lee, Yann-Hang. / VLSI CIRCUIT TESTING USING AN ADAPTIVE OPTIMIZATION MODEL. Proceedings - Design Automation Conference. New York, NY, USA : IEEE, 1987. pp. 399-406
@inproceedings{5fc4834ea3aa489eb0573e9efff32503,
title = "VLSI CIRCUIT TESTING USING AN ADAPTIVE OPTIMIZATION MODEL.",
abstract = "The purpose of testing is to determine the correctness of the unit under test in some optimal way. One difficulty in meeting the optimality requirement is that the stochastic properties of the unit are usually unknown a priori; e. g. , the yield of a VLSI production line might not be known exactly before the chips made as a result are tested. Given the probability of unit failure and the coverage of a test, the optimal test period is easy to obtain. However, the probability of failure is not usually known a priori. The authors therefore develop an optimal sequential testing strategy which estimates the production yield based on ongoing test results, and then use it to determine the optimal test period.",
author = "Yu, {Philip S.} and Krishna, {C. M.} and Yann-Hang Lee",
year = "1987",
language = "English (US)",
isbn = "0818607815",
pages = "399--406",
booktitle = "Proceedings - Design Automation Conference",
publisher = "IEEE",

}

TY - GEN

T1 - VLSI CIRCUIT TESTING USING AN ADAPTIVE OPTIMIZATION MODEL.

AU - Yu, Philip S.

AU - Krishna, C. M.

AU - Lee, Yann-Hang

PY - 1987

Y1 - 1987

N2 - The purpose of testing is to determine the correctness of the unit under test in some optimal way. One difficulty in meeting the optimality requirement is that the stochastic properties of the unit are usually unknown a priori; e. g. , the yield of a VLSI production line might not be known exactly before the chips made as a result are tested. Given the probability of unit failure and the coverage of a test, the optimal test period is easy to obtain. However, the probability of failure is not usually known a priori. The authors therefore develop an optimal sequential testing strategy which estimates the production yield based on ongoing test results, and then use it to determine the optimal test period.

AB - The purpose of testing is to determine the correctness of the unit under test in some optimal way. One difficulty in meeting the optimality requirement is that the stochastic properties of the unit are usually unknown a priori; e. g. , the yield of a VLSI production line might not be known exactly before the chips made as a result are tested. Given the probability of unit failure and the coverage of a test, the optimal test period is easy to obtain. However, the probability of failure is not usually known a priori. The authors therefore develop an optimal sequential testing strategy which estimates the production yield based on ongoing test results, and then use it to determine the optimal test period.

UR - http://www.scopus.com/inward/record.url?scp=0023273207&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0023273207&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:0023273207

SN - 0818607815

SP - 399

EP - 406

BT - Proceedings - Design Automation Conference

PB - IEEE

CY - New York, NY, USA

ER -