VLSI CIRCUIT TESTING USING AN ADAPTIVE OPTIMIZATION MODEL.

Philip S. Yu, C. M. Krishna, Yann Hang Lee

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The purpose of testing is to determine the correctness of the unit under test in some optimal way. One difficulty in meeting the optimality requirement is that the stochastic properties of the unit are usually unknown a priori; e. g. , the yield of a VLSI production line might not be known exactly before the chips made as a result are tested. Given the probability of unit failure and the coverage of a test, the optimal test period is easy to obtain. However, the probability of failure is not usually known a priori. The authors therefore develop an optimal sequential testing strategy which estimates the production yield based on ongoing test results, and then use it to determine the optimal test period.

Original languageEnglish (US)
Title of host publicationProceedings - Design Automation Conference
PublisherIEEE
Pages399-406
Number of pages8
ISBN (Print)0818607815, 9780818607813
DOIs
StatePublished - Jan 1 1987
Externally publishedYes

Publication series

NameProceedings - Design Automation Conference
ISSN (Print)0146-7123

ASJC Scopus subject areas

  • Engineering(all)

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  • Cite this

    Yu, P. S., Krishna, C. M., & Lee, Y. H. (1987). VLSI CIRCUIT TESTING USING AN ADAPTIVE OPTIMIZATION MODEL. In Proceedings - Design Automation Conference (pp. 399-406). (Proceedings - Design Automation Conference). IEEE. https://doi.org/10.1145/37888.37948