Verification Patterns for Rapid Embedded System Verification

W. T. Tsai, F. Zhu, L. Yu, R. Paul, C. Fan

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Scopus citations

Abstract

Test result verification is always a costly task for embedded system testing. This paper presents a systematic process to develop verification patterns and use these patterns to verify test results for state-based real-time/embedded systems. The verification patterns are organized into an object-oriented verification framework so that it can be adaptive to changes rapidly The verification patterns are reusable and thus can save significant time and effort in constructing the test execution infrastructure and generating test scripts. This paper describes a systematic process to perform rapid embedded system verification: 1) abstracts verification patterns based on requirement/scenario patterns analysis; 2) generates test cases/scripts from the verification patterns; 3) develops data acquisition component for raw data retrieval and event assemblers; 4) executes test scripts locally or remotely, and 5) collects and analyzes the test results. This process has been applied to a car-alarm system and implantable device applications, which shows the framework developed can perform the verification tasks efficiently.

Original languageEnglish (US)
Title of host publicationProceedings of the International Conference on Embedded Systems and Applications, ESA 03
EditorsH.R. Arabnia, L.T. Yang, H.R. Arabnia, L.T. Yang
Pages310-316
Number of pages7
StatePublished - Dec 1 2003
EventProceedings of the International Conference on Embedded Systems and Applications, ESA'03 - Las Vegas, NV, United States
Duration: Jun 23 2003Jun 26 2003

Publication series

NameProceedings of the International Conference on Embedded Systems and Applications

Other

OtherProceedings of the International Conference on Embedded Systems and Applications, ESA'03
CountryUnited States
CityLas Vegas, NV
Period6/23/036/26/03

ASJC Scopus subject areas

  • Engineering(all)

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