Velocity measurements in microchannels with a laser scanning microscope and particle linear image velocimetry

S. H. Chao, M. R. Holl, J. H. Koschwanez, R. H. Carlson, L. S. Jang, D. R. Meldrum

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A novel velocity measurement method for microscale flow field characterization is reported, particle linear image velocimetry (PLIV). The method records a series of one-dimensional images that represent the trace of particles in the flow across a one-dimensional imager. Linear imaging results in a faster frame rate than planar imaging, allowing observation of larger microscope magnification or measurement of faster flow rates in real-time than comparable techniques. In contrast to particle image velocimetry (PIV), PLIV does not require high-speed cameras or shutters. Furthermore, PLIV is adaptable to multiple linear imager formats and, as one example, can use laser scanning confocal microscopes (LSCM) that acquire images slowly but with high spatial resolutions and optical sectioning ability. Higher resolution can be obtained for flows where in-plane velocity gradient in the direction of the optical path (z-direction) is important. This paper presents the PLIV algorithm, and demonstrates its utility by measuring Poiseuille flow with 1-μm resolution in a microfluidic environment.

Original languageEnglish (US)
Title of host publicationProceedings of the Second International Conference on Microchannels and Minichannels (ICMM2004)
PublisherAmerican Society of Mechanical Engineers
Pages925-930
Number of pages6
ISBN (Print)0791841642, 9780791841648
DOIs
StatePublished - 2004
Externally publishedYes
EventProceedings of the Second International Conference on Microchannels and Minichannels (ICMM2004) - Rochester, NY, United States
Duration: Jun 17 2004Jun 19 2004

Publication series

NameProceedings of the Second International Conference on Microchannels and Minichannels (ICMM2004)

Other

OtherProceedings of the Second International Conference on Microchannels and Minichannels (ICMM2004)
Country/TerritoryUnited States
CityRochester, NY
Period6/17/046/19/04

ASJC Scopus subject areas

  • General Engineering

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