Variational interconnect delay metrics for statistical timing analysis

Praveen Ghanta, Sarma Vrudhula

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Scopus citations

Abstract

For statistical timing analysis and physical design optimization, interconnect delay metrics that model the delay as a function of the metal process variations are very important. Accurate linear or at most second order delay models in terms of the process variables are necessary to efficiently propagate uncertainty in the state-of-the-art VLSI designs with millions of transistors and on chip interconnects. In this paper, we develop a method to extend the traditional moment based delay analysis of interconnects to consider the impact of Gaussian metal process variations and obtain mean-square optimal linear delay models for interconnects. We consider linear models for the variations in the conductance and capacitance of interconnects and represent the moments (m0, m1, m2) of the interconnect impulse response as a first order orthogonal polynomial series expansion in the process variables. We obtain the coefficients of the expansion by using the Galerkin residual error minimization method on the recursive equations that relate the interconnect moments (m0, m1, m2). We compare the accuracy of our approach against SPICE based Monte Carlo simulations and demonstrate a good match.

Original languageEnglish (US)
Title of host publicationProceedings - 7th International Symposium on Quality Electronic Design, ISQED 2006
Pages19-24
Number of pages6
DOIs
StatePublished - Dec 1 2006
Event7th International Symposium on Quality Electronic Design, ISQED 2006 - San Jose, CA, United States
Duration: Mar 27 2006Mar 29 2006

Publication series

NameProceedings - International Symposium on Quality Electronic Design, ISQED
ISSN (Print)1948-3287
ISSN (Electronic)1948-3295

Other

Other7th International Symposium on Quality Electronic Design, ISQED 2006
Country/TerritoryUnited States
CitySan Jose, CA
Period3/27/063/29/06

ASJC Scopus subject areas

  • Hardware and Architecture
  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality

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