Validation of and delay variation in total ionizing dose hardened standard cell libraries

Lawrence T. Clark, David E. Pettit, Keith Holbert, Nathan D. Hindman

Research output: Chapter in Book/Report/Conference proceedingConference contribution

8 Scopus citations

Abstract

A ring oscillator based test structure with special power multiplexing to allow accurate active and standby (leakage) power measurements with minimal test chip pin count is presented. This structure is used to validate radiation hardened by design (RHBD) standard cell library gates for TID hardness and delay. Additionally, the performance of standard commercial two-edge gates and their annular counterparts are also compared experimentally. The gate delay and energy per transition is shown to be significantly increased for some RHBD gates over their two-edge counterparts. Large ring oscillator delay variations are also shown, even with all test die from the same wafer.

Original languageEnglish (US)
Title of host publication2011 IEEE International Symposium of Circuits and Systems, ISCAS 2011
Pages2051-2054
Number of pages4
DOIs
StatePublished - Aug 2 2011
Event2011 IEEE International Symposium of Circuits and Systems, ISCAS 2011 - Rio de Janeiro, Brazil
Duration: May 15 2011May 18 2011

Publication series

NameProceedings - IEEE International Symposium on Circuits and Systems
ISSN (Print)0271-4310

Other

Other2011 IEEE International Symposium of Circuits and Systems, ISCAS 2011
CountryBrazil
CityRio de Janeiro
Period5/15/115/18/11

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Validation of and delay variation in total ionizing dose hardened standard cell libraries'. Together they form a unique fingerprint.

  • Cite this

    Clark, L. T., Pettit, D. E., Holbert, K., & Hindman, N. D. (2011). Validation of and delay variation in total ionizing dose hardened standard cell libraries. In 2011 IEEE International Symposium of Circuits and Systems, ISCAS 2011 (pp. 2051-2054). [5938000] (Proceedings - IEEE International Symposium on Circuits and Systems). https://doi.org/10.1109/ISCAS.2011.5938000