Using STEM image as a map for parallel beam electron diffraction from a nano-particle on a TEM-STEM system

Haifeng He, John Spence

Research output: Contribution to journalArticle

1 Citation (Scopus)
Original languageEnglish (US)
Pages (from-to)584-585
Number of pages2
JournalMicroscopy and Microanalysis
Volume12
Issue numberSUPPL. 2
DOIs
StatePublished - Aug 2006

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Electron diffraction
electron diffraction
Transmission electron microscopy
transmission electron microscopy

ASJC Scopus subject areas

  • Instrumentation

Cite this

Using STEM image as a map for parallel beam electron diffraction from a nano-particle on a TEM-STEM system. / He, Haifeng; Spence, John.

In: Microscopy and Microanalysis, Vol. 12, No. SUPPL. 2, 08.2006, p. 584-585.

Research output: Contribution to journalArticle

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