Using STEM image as a map for parallel beam electron diffraction from a nano-particle on a TEM-STEM system

Haifeng He, John Spence

Research output: Contribution to journalArticle

1 Scopus citations
Original languageEnglish (US)
Pages (from-to)584-585
Number of pages2
JournalMicroscopy and Microanalysis
Volume12
Issue numberSUPPL. 2
DOIs
StatePublished - Aug 1 2006

ASJC Scopus subject areas

  • Instrumentation

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