Using electric cell-substrate impedance sensing to measure changes in the projected area of individual cells

Pahnit Seriburi, Ashutosh Shastry, Tim Ren, Steven Gales, Karl F. Böhringer, Deirdre Meldrum

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

We used an electrical cell-substrate impedance sensing (ECIS) technique to measure changes in the projected area of individual cells. The projected area of the cell plays a significant role in cellular behavior, including cell spreading, cell growth, cell death and cell adhesion. We built a custom impedance sensing setup; we recorded real time impedance spectra of individual adherent cells; and we used two parameters extracted from each impedance spectrum to measure the changes in the projected area of the cell. The projected area of the cell determines how much electrical current was measured using ECIS; therefore, it directly governed the values of two extracted impedance parameters.

Original languageEnglish (US)
Title of host publicationTRANSDUCERS and EUROSENSORS '07 - 4th International Conference on Solid-State Sensors, Actuators and Microsystems
Pages469-472
Number of pages4
DOIs
StatePublished - 2007
Externally publishedYes
Event4th International Conference on Solid-State Sensors, Actuators and Microsystems, TRANSDUCERS and EUROSENSORS '07 - Lyon, France
Duration: Jun 10 2007Jun 14 2007

Other

Other4th International Conference on Solid-State Sensors, Actuators and Microsystems, TRANSDUCERS and EUROSENSORS '07
CountryFrance
CityLyon
Period6/10/076/14/07

Fingerprint

Electric batteries
Cell adhesion
Cell growth
Cell death
Substrates
Cells

Keywords

  • Cell-substrate
  • Impedance
  • Individual cells

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Electrical and Electronic Engineering

Cite this

Seriburi, P., Shastry, A., Ren, T., Gales, S., Böhringer, K. F., & Meldrum, D. (2007). Using electric cell-substrate impedance sensing to measure changes in the projected area of individual cells. In TRANSDUCERS and EUROSENSORS '07 - 4th International Conference on Solid-State Sensors, Actuators and Microsystems (pp. 469-472). [4300169] https://doi.org/10.1109/SENSOR.2007.4300169

Using electric cell-substrate impedance sensing to measure changes in the projected area of individual cells. / Seriburi, Pahnit; Shastry, Ashutosh; Ren, Tim; Gales, Steven; Böhringer, Karl F.; Meldrum, Deirdre.

TRANSDUCERS and EUROSENSORS '07 - 4th International Conference on Solid-State Sensors, Actuators and Microsystems. 2007. p. 469-472 4300169.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Seriburi, P, Shastry, A, Ren, T, Gales, S, Böhringer, KF & Meldrum, D 2007, Using electric cell-substrate impedance sensing to measure changes in the projected area of individual cells. in TRANSDUCERS and EUROSENSORS '07 - 4th International Conference on Solid-State Sensors, Actuators and Microsystems., 4300169, pp. 469-472, 4th International Conference on Solid-State Sensors, Actuators and Microsystems, TRANSDUCERS and EUROSENSORS '07, Lyon, France, 6/10/07. https://doi.org/10.1109/SENSOR.2007.4300169
Seriburi P, Shastry A, Ren T, Gales S, Böhringer KF, Meldrum D. Using electric cell-substrate impedance sensing to measure changes in the projected area of individual cells. In TRANSDUCERS and EUROSENSORS '07 - 4th International Conference on Solid-State Sensors, Actuators and Microsystems. 2007. p. 469-472. 4300169 https://doi.org/10.1109/SENSOR.2007.4300169
Seriburi, Pahnit ; Shastry, Ashutosh ; Ren, Tim ; Gales, Steven ; Böhringer, Karl F. ; Meldrum, Deirdre. / Using electric cell-substrate impedance sensing to measure changes in the projected area of individual cells. TRANSDUCERS and EUROSENSORS '07 - 4th International Conference on Solid-State Sensors, Actuators and Microsystems. 2007. pp. 469-472
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