Abstract

An improved model of copper p-type doping in CdTe absorbers is proposed that accounts for the mechanisms related to tightly bound Cu(i)-Cu(Cd) and Cd(i)-Cu(Cd) complexes that both limit diffusion and cause self-compensation of Cu species. The new model explains apparent discrepancy between DFT-calculated and fitted diffusion parameters of Cu reported in our previous work, and allows for better understanding of performance and metastabilities in CdTe PV devices.

Original languageEnglish (US)
Title of host publication2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1-4
Number of pages4
ISBN (Electronic)9781509056057
DOIs
StatePublished - May 25 2018
Event44th IEEE Photovoltaic Specialist Conference, PVSC 2017 - Washington, United States
Duration: Jun 25 2017Jun 30 2017

Other

Other44th IEEE Photovoltaic Specialist Conference, PVSC 2017
CountryUnited States
CityWashington
Period6/25/176/30/17

Fingerprint

Doping (additives)
Discrete Fourier transforms
Copper
Compensation and Redress

Keywords

  • CdTe
  • Copper
  • Diffusion
  • Numerical simulations
  • Photovoltaic cells
  • Semiconductor device doping

ASJC Scopus subject areas

  • Renewable Energy, Sustainability and the Environment
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

Cite this

Guo, D., Akis, R., Brinkman, D., Moore, A., Yang, J. H., Krasikov, D., ... Vasileska, D. (2018). Using diffusion-reaction simulation to study the formation and self-compensation mechanism of Cu doping in CdTe. In 2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017 (pp. 1-4). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PVSC.2017.8366437

Using diffusion-reaction simulation to study the formation and self-compensation mechanism of Cu doping in CdTe. / Guo, D.; Akis, R.; Brinkman, D.; Moore, A.; Yang, J. H.; Krasikov, D.; Sankin, I.; Ringhofer, Christian; Vasileska, Dragica.

2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017. Institute of Electrical and Electronics Engineers Inc., 2018. p. 1-4.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Guo, D, Akis, R, Brinkman, D, Moore, A, Yang, JH, Krasikov, D, Sankin, I, Ringhofer, C & Vasileska, D 2018, Using diffusion-reaction simulation to study the formation and self-compensation mechanism of Cu doping in CdTe. in 2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017. Institute of Electrical and Electronics Engineers Inc., pp. 1-4, 44th IEEE Photovoltaic Specialist Conference, PVSC 2017, Washington, United States, 6/25/17. https://doi.org/10.1109/PVSC.2017.8366437
Guo D, Akis R, Brinkman D, Moore A, Yang JH, Krasikov D et al. Using diffusion-reaction simulation to study the formation and self-compensation mechanism of Cu doping in CdTe. In 2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017. Institute of Electrical and Electronics Engineers Inc. 2018. p. 1-4 https://doi.org/10.1109/PVSC.2017.8366437
Guo, D. ; Akis, R. ; Brinkman, D. ; Moore, A. ; Yang, J. H. ; Krasikov, D. ; Sankin, I. ; Ringhofer, Christian ; Vasileska, Dragica. / Using diffusion-reaction simulation to study the formation and self-compensation mechanism of Cu doping in CdTe. 2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017. Institute of Electrical and Electronics Engineers Inc., 2018. pp. 1-4
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