Useful ion yields for Cameca IMS 3f and 6f SIMS: Limits on quantitative analysis

Richard Hervig; Frank K. Mazdab; Peter Williams; Yunbin Guan; Gary R. Huss; Laurie A. Leshin

doi:10.1016/j.chemgeo.2005.09.008

Useful ion yields for Cameca IMS 3f and 6f SIMS: Limits on quantitative analysis

Richard Hervig, Frank K. Mazdab, Peter Williams, Yunbin Guan, Gary R. Huss, Laurie A. Leshin

Research output: Contribution to journal › Article › peer-review

68 Scopus citations

Abstract

The useful yields (ions detected/atom sputtered) of major and trace elements in NIST 610 glass were measured by secondary ion mass spectrometry (SIMS) using Cameca IMS 3f and 6f instruments. Useful yields of positive ions at maximum transmission range from 10^-4 to 0.2 and are negatively correlated with ionization potential. We quantified the decrease in useful yields when applying energy filtering or high mass resolution techniques to remove molecular interferences. The useful yields of selected negative ions (O, S, Au) in magnetite and pyrite were also determined. These data allow the analyst to determine if a particular analysis (trace element contents or isotopic ratio) can be achieved, given the amount of sample available and the conditions of the analysis.

Original language	English (US)
Pages (from-to)	83-99
Number of pages	17
Journal	Chemical Geology
Volume	227
Issue number	1-2
DOIs	https://doi.org/10.1016/j.chemgeo.2005.09.008
State	Published - Mar 20 2006

Keywords

Analytical technique
Isotope geochemistry
Secondary ion mass spectrometry (SIMS)
Trace element geochemistry

ASJC Scopus subject areas

Geology
Geochemistry and Petrology

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10.1016/j.chemgeo.2005.09.008

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@article{0da82209b4bc43c5bbfd040afd487e2e,

title = "Useful ion yields for Cameca IMS 3f and 6f SIMS: Limits on quantitative analysis",

abstract = "The useful yields (ions detected/atom sputtered) of major and trace elements in NIST 610 glass were measured by secondary ion mass spectrometry (SIMS) using Cameca IMS 3f and 6f instruments. Useful yields of positive ions at maximum transmission range from 10-4 to 0.2 and are negatively correlated with ionization potential. We quantified the decrease in useful yields when applying energy filtering or high mass resolution techniques to remove molecular interferences. The useful yields of selected negative ions (O, S, Au) in magnetite and pyrite were also determined. These data allow the analyst to determine if a particular analysis (trace element contents or isotopic ratio) can be achieved, given the amount of sample available and the conditions of the analysis.",

keywords = "Analytical technique, Isotope geochemistry, Secondary ion mass spectrometry (SIMS), Trace element geochemistry",

author = "Richard Hervig and Mazdab, {Frank K.} and Peter Williams and Yunbin Guan and Huss, {Gary R.} and Leshin, {Laurie A.}",

note = "Funding Information: We thank the National Science Foundation Instrumentation and Facilities Program for sponsoring SIMS workshops associated with the UCLA (1997), Woods Hole (1999), and ASU (2001) SIMS laboratories where many of these concepts were discussed formally and informally. This material is based on work supported by the National Science Foundation under grant number EAR-0091796. [RR] ",

year = "2006",

month = mar,

day = "20",

doi = "10.1016/j.chemgeo.2005.09.008",

language = "English (US)",

volume = "227",

pages = "83--99",

journal = "Chemical Geology",

issn = "0009-2541",

publisher = "Elsevier",

number = "1-2",

}

TY - JOUR

T1 - Useful ion yields for Cameca IMS 3f and 6f SIMS

T2 - Limits on quantitative analysis

AU - Hervig, Richard

AU - Mazdab, Frank K.

AU - Williams, Peter

AU - Guan, Yunbin

AU - Huss, Gary R.

AU - Leshin, Laurie A.

N1 - Funding Information: We thank the National Science Foundation Instrumentation and Facilities Program for sponsoring SIMS workshops associated with the UCLA (1997), Woods Hole (1999), and ASU (2001) SIMS laboratories where many of these concepts were discussed formally and informally. This material is based on work supported by the National Science Foundation under grant number EAR-0091796. [RR]

PY - 2006/3/20

Y1 - 2006/3/20

N2 - The useful yields (ions detected/atom sputtered) of major and trace elements in NIST 610 glass were measured by secondary ion mass spectrometry (SIMS) using Cameca IMS 3f and 6f instruments. Useful yields of positive ions at maximum transmission range from 10-4 to 0.2 and are negatively correlated with ionization potential. We quantified the decrease in useful yields when applying energy filtering or high mass resolution techniques to remove molecular interferences. The useful yields of selected negative ions (O, S, Au) in magnetite and pyrite were also determined. These data allow the analyst to determine if a particular analysis (trace element contents or isotopic ratio) can be achieved, given the amount of sample available and the conditions of the analysis.

AB - The useful yields (ions detected/atom sputtered) of major and trace elements in NIST 610 glass were measured by secondary ion mass spectrometry (SIMS) using Cameca IMS 3f and 6f instruments. Useful yields of positive ions at maximum transmission range from 10-4 to 0.2 and are negatively correlated with ionization potential. We quantified the decrease in useful yields when applying energy filtering or high mass resolution techniques to remove molecular interferences. The useful yields of selected negative ions (O, S, Au) in magnetite and pyrite were also determined. These data allow the analyst to determine if a particular analysis (trace element contents or isotopic ratio) can be achieved, given the amount of sample available and the conditions of the analysis.

KW - Analytical technique

KW - Isotope geochemistry

KW - Secondary ion mass spectrometry (SIMS)

KW - Trace element geochemistry

UR - http://www.scopus.com/inward/record.url?scp=33344471908&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=33344471908&partnerID=8YFLogxK

U2 - 10.1016/j.chemgeo.2005.09.008

DO - 10.1016/j.chemgeo.2005.09.008

M3 - Article

AN - SCOPUS:33344471908

SN - 0009-2541

VL - 227

SP - 83

EP - 99

JO - Chemical Geology

JF - Chemical Geology

IS - 1-2

ER -

Useful ion yields for Cameca IMS 3f and 6f SIMS: Limits on quantitative analysis

Abstract

Keywords

ASJC Scopus subject areas

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