Use of pockers readout optical modulators (PROMS) for atomic resolution electron image processing

John Spence, A. Olsen

Research output: Contribution to journalArticle

3 Scopus citations

Abstract

The usefulness of PROMS for high resolution electron microscopy is outlined. A theoretical model for direct electron beam image storage in PROMS is given, and computed results discussed. Wear-atomic resolution electron images of the Bi12Si020 crystal structure are shown and discussed.

Original languageEnglish (US)
Pages (from-to)154-160
Number of pages7
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume218
DOIs
StatePublished - Apr 25 1980

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ASJC Scopus subject areas

  • Applied Mathematics
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering
  • Computer Science Applications

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