Abstract
It is shown that a unique retrieval of the single scattering electron energy loss distribution from experimental multiple loss data is only possible if it can be assumed that energy gain of the fast electron does not occur. The method given holds for any value of the scattering parameter t λ and to spectra to which many distinct processes contribute. An example of the retrieval method is given, applied to the experimental loss spectrum of a thin aluminum foil with t λ = 10.
Original language | English (US) |
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Pages (from-to) | 9-12 |
Number of pages | 4 |
Journal | Ultramicroscopy |
Volume | 4 |
Issue number | 1 |
DOIs | |
State | Published - 1979 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Instrumentation