Understanding thin film X‐ray spectra

J. N. Chapman, W. A P Nicholson, Peter Crozier

Research output: Contribution to journalArticle

16 Citations (Scopus)

Abstract

Formulae suitable for predicting X‐ray production cross‐sections in thin foils are described. A modified Bethe‐Heitler equation seems well suited to describe the production of bremsstrahlung photons and, for fixed experimental conditions, may be expressed in a simple parametric form. Simple equations for calculating characteristic photon production are less satisfactory and the predictions of different formulae differ markedly. For microanalytical purposes, however, where relative rather than absolute cross‐sections are required, the differences become less pronounced. Finally, some uses for the cross‐sections in X‐ray microanalysis are considered. 1984 Blackwell Science Ltd

Original languageEnglish (US)
Pages (from-to)179-191
Number of pages13
JournalJournal of Microscopy
Volume136
Issue number2
DOIs
StatePublished - 1984
Externally publishedYes

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X-Ray Film
Photons
X-Rays

Keywords

  • microanalysis
  • thin film
  • X‐ray cross‐sections

ASJC Scopus subject areas

  • Pathology and Forensic Medicine
  • Histology

Cite this

Understanding thin film X‐ray spectra. / Chapman, J. N.; Nicholson, W. A P; Crozier, Peter.

In: Journal of Microscopy, Vol. 136, No. 2, 1984, p. 179-191.

Research output: Contribution to journalArticle

Chapman, J. N. ; Nicholson, W. A P ; Crozier, Peter. / Understanding thin film X‐ray spectra. In: Journal of Microscopy. 1984 ; Vol. 136, No. 2. pp. 179-191.
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