Understanding gaas Native Oxides by Correlating Three Liquid Contact Angle Analysis (3LCAA) and High Resolution Ion Beam Analysis (HR-IBA) to X-Ray Photoelectron Spectroscopy (XPS) as Function of Surface Processing
Sukesh Ram, Amber A. Chow, Shaurya Khanna, Nikhil C. Suresh, Franscesca J. Ark, Saaketh R. Narayan, Aashi R. Gurijala, Jack M. Day, Timothy Karcher, Robert J. Culbertson, Shawn D. Whaley, Karen L. Kavanagh, Nicole Herbots
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