Ultraintense x-ray induced ionization, dissociation, and frustrated absorption in molecular nitrogen

M. Hoener, L. Fang, O. Kornilov, O. Gessner, S. T. Pratt, M. Gühr, E. P. Kanter, C. Blaga, C. Bostedt, J. D. Bozek, P. H. Bucksbaum, C. Buth, M. Chen, R. Coffee, J. Cryan, L. Dimauro, M. Glownia, E. Hosler, E. Kukk, S. R. Leone & 6 others B. McFarland, Marc Messerschmidt, B. Murphy, V. Petrovic, D. Rolles, N. Berrah

Research output: Contribution to journalArticle

145 Citations (Scopus)

Abstract

Sequential multiple photoionization of the prototypical molecule N2 is studied with femtosecond time resolution using the Linac Coherent Light Source (LCLS). A detailed picture of intense x-ray induced ionization and dissociation dynamics is revealed, including a molecular mechanism of frustrated absorption that suppresses the formation of high charge states at short pulse durations. The inverse scaling of the average target charge state with x-ray peak brightness has possible implications for single-pulse imaging applications.

Original languageEnglish (US)
Article number253002
JournalPhysical Review Letters
Volume104
Issue number25
DOIs
StatePublished - Jun 23 2010
Externally publishedYes

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dissociation
nitrogen
ionization
coherent light
photoionization
light sources
brightness
pulse duration
x rays
scaling
pulses
molecules

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Hoener, M., Fang, L., Kornilov, O., Gessner, O., Pratt, S. T., Gühr, M., ... Berrah, N. (2010). Ultraintense x-ray induced ionization, dissociation, and frustrated absorption in molecular nitrogen. Physical Review Letters, 104(25), [253002]. https://doi.org/10.1103/PhysRevLett.104.253002

Ultraintense x-ray induced ionization, dissociation, and frustrated absorption in molecular nitrogen. / Hoener, M.; Fang, L.; Kornilov, O.; Gessner, O.; Pratt, S. T.; Gühr, M.; Kanter, E. P.; Blaga, C.; Bostedt, C.; Bozek, J. D.; Bucksbaum, P. H.; Buth, C.; Chen, M.; Coffee, R.; Cryan, J.; Dimauro, L.; Glownia, M.; Hosler, E.; Kukk, E.; Leone, S. R.; McFarland, B.; Messerschmidt, Marc; Murphy, B.; Petrovic, V.; Rolles, D.; Berrah, N.

In: Physical Review Letters, Vol. 104, No. 25, 253002, 23.06.2010.

Research output: Contribution to journalArticle

Hoener, M, Fang, L, Kornilov, O, Gessner, O, Pratt, ST, Gühr, M, Kanter, EP, Blaga, C, Bostedt, C, Bozek, JD, Bucksbaum, PH, Buth, C, Chen, M, Coffee, R, Cryan, J, Dimauro, L, Glownia, M, Hosler, E, Kukk, E, Leone, SR, McFarland, B, Messerschmidt, M, Murphy, B, Petrovic, V, Rolles, D & Berrah, N 2010, 'Ultraintense x-ray induced ionization, dissociation, and frustrated absorption in molecular nitrogen', Physical Review Letters, vol. 104, no. 25, 253002. https://doi.org/10.1103/PhysRevLett.104.253002
Hoener, M. ; Fang, L. ; Kornilov, O. ; Gessner, O. ; Pratt, S. T. ; Gühr, M. ; Kanter, E. P. ; Blaga, C. ; Bostedt, C. ; Bozek, J. D. ; Bucksbaum, P. H. ; Buth, C. ; Chen, M. ; Coffee, R. ; Cryan, J. ; Dimauro, L. ; Glownia, M. ; Hosler, E. ; Kukk, E. ; Leone, S. R. ; McFarland, B. ; Messerschmidt, Marc ; Murphy, B. ; Petrovic, V. ; Rolles, D. ; Berrah, N. / Ultraintense x-ray induced ionization, dissociation, and frustrated absorption in molecular nitrogen. In: Physical Review Letters. 2010 ; Vol. 104, No. 25.
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