Ultra-low-voltage scanning electron microscopy in the FEG-SEM

Research output: Contribution to journal › Article › peer-review

Original language	English (US)
Pages (from-to)	706-707
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	8
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/s1431927602106167
State	Published - 2002
Externally published	Yes

ASJC Scopus subject areas

@article{212487db01bf4a39b70c6f72550ffaa8,

title = "Ultra-low-voltage scanning electron microscopy in the FEG-SEM",

author = "Jingyue Liu",

year = "2002",

doi = "10.1017/s1431927602106167",

language = "English (US)",

volume = "8",

pages = "706--707",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

number = "SUPPL. 2",

}

TY - JOUR

T1 - Ultra-low-voltage scanning electron microscopy in the FEG-SEM

AU - Liu, Jingyue

PY - 2002

Y1 - 2002

UR - http://www.scopus.com/inward/record.url?scp=0036412134&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0036412134&partnerID=8YFLogxK

U2 - 10.1017/s1431927602106167

DO - 10.1017/s1431927602106167

M3 - Article

AN - SCOPUS:0036412134

SN - 1431-9276

VL - 8

SP - 706

EP - 707

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -