Two‐beam features in electron diffraction patterns – application to refinement of low‐order structure factors in GaAs

K. Gjønnes, J. Gjønnes, J. Zuo, John Spence

Research output: Contribution to journalArticle

12 Citations (Scopus)
Original languageEnglish (US)
Pages (from-to)810-820
Number of pages11
JournalActa Crystallographica Section A: Foundations of Crystallography
Volume44
Issue number6
DOIs
StatePublished - 1988

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Electrons
gallium arsenide

ASJC Scopus subject areas

  • Structural Biology

Cite this

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title = "Two‐beam features in electron diffraction patterns – application to refinement of low‐order structure factors in GaAs",
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