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Two-dimensional (2D) in-plane strain mapping using a laser scanning technique on the cross-section of a microelectronics package
Hanshuang Liang, Todd Houghton, Zeming Song, Teng Ma, Hoa Nguyen, George Chen, Hanqing Jiang, Hongbin Yu
- Electrical Engineering
- Connection One (C1)
- Flexible Electronics and Display Center (FEDC)
- Mechanical and Aerospace Engineering
- Adaptive Intelligent Materials and Systems Center (AIMS)
- Materials Science and Engineering
- Engineering of Matter, Transport and Energy, School for (IAFSE-SEMTE)
- Nano-Electronics, Arizona Institute of (AINE)
- Photonics Innovation, Center for (CPhI)
- Solid State Electronics Research Center (CSSER)
- Electrical, Computer, and Energy Engineering, School of (IAFSE-ECEE)
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
1
Scopus
citations