Transmission low‐energy electron diffraction (TLEED) and its application to the low‐voltage point‐projection microscope

W. Qian; John Spence; J. M. Zuo

doi:10.1107/S0108767392010705

Transmission low‐energy electron diffraction (TLEED) and its application to the low‐voltage point‐projection microscope

W. Qian, John Spence, J. M. Zuo

Physics

Research output: Contribution to journal › Article › peer-review

19 Scopus citations

Original language	English (US)
Pages (from-to)	436-445
Number of pages	10
Journal	Acta Crystallographica Section A
Volume	49
Issue number	3
DOIs	https://doi.org/10.1107/S0108767392010705
State	Published - May 1993

ASJC Scopus subject areas

Structural Biology

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title = "Transmission low‐energy electron diffraction (TLEED) and its application to the low‐voltage point‐projection microscope",

author = "W. Qian and John Spence and Zuo, {J. M.}",

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AU - Spence, John

AU - Zuo, J. M.

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JO - Acta Crystallographica Section A

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Transmission low‐energy electron diffraction (TLEED) and its application to the low‐voltage point‐projection microscope

ASJC Scopus subject areas

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