Transmission electron microscopy without aberrations: Applications to materials science

Angus Kirkland, Lan-Yun Chang, Sarah Haigh, Crispin Hetherington

Research output: Contribution to journalArticle

8 Scopus citations

Abstract

Aberration correction leads to a substantial improvement in the directly interpretable resolution of transmission electron microscopes. Direct electron optical correction based on a hexapole corrector and indirect computational analysis of a focal or tilt series of images offer complementary approaches and a combination of the two provides additional advantages. This paper describes aberration corrected instrumentation installed in Oxford which is equipped with correctors for both the image-forming and probe-forming lenses. Examples of the use of these instruments in the characterisation of nanocrystalline catalysts are given together with initial results combining direct and indirect methods.

Original languageEnglish (US)
Pages (from-to)425-428
Number of pages4
JournalCurrent Applied Physics
Volume8
Issue number3-4
DOIs
StatePublished - May 1 2008
Externally publishedYes

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Keywords

  • Aberration correction
  • Exit wave reconstruction
  • Nanocrystalline catalysis

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Materials Science (miscellaneous)

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