Transmission electron microscopy without aberrations: Applications to materials science

Angus Kirkland; Lan Yun Chang; Sarah Haigh; Crispin Hetherington

doi:10.1016/j.cap.2007.10.065

Transmission electron microscopy without aberrations: Applications to materials science

Angus Kirkland, Lan Yun Chang, Sarah Haigh, Crispin Hetherington

Research output: Contribution to journal › Article › peer-review

8 Scopus citations

Abstract

Aberration correction leads to a substantial improvement in the directly interpretable resolution of transmission electron microscopes. Direct electron optical correction based on a hexapole corrector and indirect computational analysis of a focal or tilt series of images offer complementary approaches and a combination of the two provides additional advantages. This paper describes aberration corrected instrumentation installed in Oxford which is equipped with correctors for both the image-forming and probe-forming lenses. Examples of the use of these instruments in the characterisation of nanocrystalline catalysts are given together with initial results combining direct and indirect methods.

Original language	English (US)
Pages (from-to)	425-428
Number of pages	4
Journal	Current Applied Physics
Volume	8
Issue number	3-4
DOIs	https://doi.org/10.1016/j.cap.2007.10.065
State	Published - May 2008
Externally published	Yes

Keywords

Aberration correction
Exit wave reconstruction
Nanocrystalline catalysis

ASJC Scopus subject areas

Materials Science(all)
Physics and Astronomy(all)

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10.1016/j.cap.2007.10.065

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title = "Transmission electron microscopy without aberrations: Applications to materials science",

abstract = "Aberration correction leads to a substantial improvement in the directly interpretable resolution of transmission electron microscopes. Direct electron optical correction based on a hexapole corrector and indirect computational analysis of a focal or tilt series of images offer complementary approaches and a combination of the two provides additional advantages. This paper describes aberration corrected instrumentation installed in Oxford which is equipped with correctors for both the image-forming and probe-forming lenses. Examples of the use of these instruments in the characterisation of nanocrystalline catalysts are given together with initial results combining direct and indirect methods.",

keywords = "Aberration correction, Exit wave reconstruction, Nanocrystalline catalysis",

author = "Angus Kirkland and Chang, {Lan Yun} and Sarah Haigh and Crispin Hetherington",

note = "Funding Information: Financial support from EPSRC, the Leverhulme trust and the Royal Society is gratefully acknowledged. ",

year = "2008",

month = may,

doi = "10.1016/j.cap.2007.10.065",

language = "English (US)",

volume = "8",

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journal = "Current Applied Physics",

issn = "1567-1739",

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T1 - Transmission electron microscopy without aberrations

T2 - Applications to materials science

AU - Kirkland, Angus

AU - Chang, Lan Yun

AU - Haigh, Sarah

AU - Hetherington, Crispin

N1 - Funding Information: Financial support from EPSRC, the Leverhulme trust and the Royal Society is gratefully acknowledged.

PY - 2008/5

Y1 - 2008/5

N2 - Aberration correction leads to a substantial improvement in the directly interpretable resolution of transmission electron microscopes. Direct electron optical correction based on a hexapole corrector and indirect computational analysis of a focal or tilt series of images offer complementary approaches and a combination of the two provides additional advantages. This paper describes aberration corrected instrumentation installed in Oxford which is equipped with correctors for both the image-forming and probe-forming lenses. Examples of the use of these instruments in the characterisation of nanocrystalline catalysts are given together with initial results combining direct and indirect methods.

AB - Aberration correction leads to a substantial improvement in the directly interpretable resolution of transmission electron microscopes. Direct electron optical correction based on a hexapole corrector and indirect computational analysis of a focal or tilt series of images offer complementary approaches and a combination of the two provides additional advantages. This paper describes aberration corrected instrumentation installed in Oxford which is equipped with correctors for both the image-forming and probe-forming lenses. Examples of the use of these instruments in the characterisation of nanocrystalline catalysts are given together with initial results combining direct and indirect methods.

KW - Aberration correction

KW - Exit wave reconstruction

KW - Nanocrystalline catalysis

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JO - Current Applied Physics

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ER -

Transmission electron microscopy without aberrations: Applications to materials science

Abstract

Keywords

ASJC Scopus subject areas

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