Transmission electron microscopy of liquid phase densified SiC

Ray Carpenter, W. Braue, Raymond A. Cutler

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Transmission electron microscopy was used to characterize microstructures of SiC densified using a transient liquid phase (resulting from the reaction of Al2O3 with Al4C3) by hot pressing at 1875°C for 10 min in N2. High-resolution electron microscopy showed that the SiC grain boundaries were free of glassy phases, suggesting that all liquid phases crystallized upon cooling. Phases that might be expected due to reactive sintering (i.e., AIN, Al2OC, Al2O3, Al4O4C, Al3O3N, or solid solutions of SiC, AIN, and Al2OC) were not observed. However, significant Al, Si, O, and C concentrations were found at all triple junctions of these rapidly densified ceramics.

Original languageEnglish (US)
Pages (from-to)1937-1944
Number of pages8
JournalJournal of Materials Research
Issue number9
Publication statusPublished - Sep 1991


ASJC Scopus subject areas

  • Materials Science(all)

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