Abstract
This paper presents general transmission electron microscopy observations of polymeric sol-gel derived PZT(52/48) thin films that were heat treated in a conventional furnace for 1 hour at 700°C. Results from high resolution TEM, EDS and EELS are also included. The thin films revealed a complex microstructure with dispersed nanocrystalline PbO second phase, embedded porosity, local chemical inhomogeneities, and residual organics. Intricate ferroelectric domain configurations were observed in the thin film grains, which were found to be sensitive to continuous electron beam irradiation. Some artifacts intrinsic to transmission electron microscopy are outlined and their consequences discussed.
Original language | English (US) |
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Pages (from-to) | 321-331 |
Number of pages | 11 |
Journal | Integrated Ferroelectrics |
Volume | 5 |
Issue number | 4 |
DOIs | |
State | Published - Dec 1994 |
Keywords
- PbZr0PbTiO
- Sol-gel
- ferroelectric
- thin films
- transmission electron microscopy
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Control and Systems Engineering
- Ceramics and Composites
- Condensed Matter Physics
- Electrical and Electronic Engineering
- Materials Chemistry