Transmission electron microscopy observations of magnetic multilayers

A. R. Modak; S. S P Parkin; David Smith

doi:10.1016/0304-3991(92)90168-J

Transmission electron microscopy observations of magnetic multilayers

A. R. Modak, S. S P Parkin, David Smith

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13 Scopus citations

Abstract

Transmission electron microscopy has been used for structural characterization of magnetic multilayers of particular interest because of their coupling behavior and giant magnetoresistance. Some case studies of multilayers, grown by DC magnetron sputtering, are presented and discussed. These include examples from the Co/Cu, NiFe/Cu and Fe/Co systems.

Original language	English (US)
Pages (from-to)	375-382
Number of pages	8
Journal	Ultramicroscopy
Volume	47
Issue number	4
DOIs	https://doi.org/10.1016/0304-3991(92)90168-J
State	Published - Dec 1992

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Instrumentation

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10.1016/0304-3991(92)90168-J

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title = "Transmission electron microscopy observations of magnetic multilayers",

abstract = "Transmission electron microscopy has been used for structural characterization of magnetic multilayers of particular interest because of their coupling behavior and giant magnetoresistance. Some case studies of multilayers, grown by DC magnetron sputtering, are presented and discussed. These include examples from the Co/Cu, NiFe/Cu and Fe/Co systems.",

author = "Modak, {A. R.} and Parkin, {S. S P} and David Smith",

year = "1992",

month = dec,

doi = "10.1016/0304-3991(92)90168-J",

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journal = "Ultramicroscopy",

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T1 - Transmission electron microscopy observations of magnetic multilayers

AU - Modak, A. R.

AU - Parkin, S. S P

AU - Smith, David

PY - 1992/12

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N2 - Transmission electron microscopy has been used for structural characterization of magnetic multilayers of particular interest because of their coupling behavior and giant magnetoresistance. Some case studies of multilayers, grown by DC magnetron sputtering, are presented and discussed. These include examples from the Co/Cu, NiFe/Cu and Fe/Co systems.

AB - Transmission electron microscopy has been used for structural characterization of magnetic multilayers of particular interest because of their coupling behavior and giant magnetoresistance. Some case studies of multilayers, grown by DC magnetron sputtering, are presented and discussed. These include examples from the Co/Cu, NiFe/Cu and Fe/Co systems.

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U2 - 10.1016/0304-3991(92)90168-J

DO - 10.1016/0304-3991(92)90168-J

M3 - Article

AN - SCOPUS:0027102628

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VL - 47

SP - 375

EP - 382

JO - Ultramicroscopy

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IS - 4

ER -

Transmission electron microscopy observations of magnetic multilayers

Abstract

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