Transmission electron microscopy observations of magnetic multilayers

A. R. Modak, S. S P Parkin, David Smith

Research output: Contribution to journalArticlepeer-review

11 Scopus citations


Transmission electron microscopy has been used for structural characterization of magnetic multilayers of particular interest because of their coupling behavior and giant magnetoresistance. Some case studies of multilayers, grown by DC magnetron sputtering, are presented and discussed. These include examples from the Co/Cu, NiFe/Cu and Fe/Co systems.

Original languageEnglish (US)
Pages (from-to)375-382
Number of pages8
Issue number4
StatePublished - Dec 1992

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation


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